Modeling absorption of rough interface between dielectric and conductive medium

The effects of a random tough surface between dielectric and lossy conductive medium on power absorption are analyzed by considering incident plane waves impinging on the interface. We use two methods to formulate and solve the 2-D problem: the two-media small perturbation method to second order (SPM2) and the numerical system transfer operator matrix method, referred to as T-matrix method. The two methods are in agreement within the regimes of validity. The results show significant difference between absorption of a rough surface and that of a smooth surface. Surface fields are further examined numerically. (c) 2006 Wiley Periodicals, Inc.