Enhancement of topographic images obtained in liquid media by atomic force microscopy

被引:8
|
作者
Kim, Younghun
Yi, Jongheop
机构
[1] Seoul Natl Univ, Sch Chem & Biol Engn, Seoul 151742, South Korea
[2] Kwangwoon Univ, Dept Chem Engn, Seoul 139701, South Korea
来源
JOURNAL OF PHYSICAL CHEMISTRY B | 2006年 / 110卷 / 41期
关键词
D O I
10.1021/jp063591+
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The open liquid-cell atomic force microscope (AFM) has potential for studies of biomaterials and surface morphology in liquid media, and a variety of fluids can be used as buffer solutions. The dependence of image distortion on fluid properties (kinematic viscosity) has been studied with edge friction force obtained in lateral images and will shortly appear elsewhere [Appl. Phys. Lett. 2006, 88, 173121]. Previous studies indicate that the scan rate should be slower for obtaining a nondistorted image. However, the time required for the scan is greatly increased. Therefore, we introduced the vector concept to evaluate the net force for scanning in the y-direction and found two solutions to achieve a zero force difference introduced by the cantilever-fluid and the tip-surface. When the scan rate approaches zero or a specific velocity (30 mu m/s in this study), the force of the interaction induced by the cantilever-fluid and tip-surface is reduced to a considerable extent. Among the two solutions, a scan with a specific velocity is an easy, rapid method for obtaining a nondistorted image, compared to the previously proposed method (scan rate approaches zero). This proposed model was confirmed in a proof-of-concept test using 2-propanol.
引用
收藏
页码:20526 / 20532
页数:7
相关论文
共 50 条
  • [1] Topographic Contrast in Force Modulation Atomic Force Microscopy Images
    Yang, Chunlai
    Zheng, Cheng
    Chen, Yuhang
    Huang, Wenhao
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, 51 (05)
  • [2] On the nature and propagation of errors in roughness parameters obtained from spectral analysis of atomic force microscopy topographic images
    Chrostowski, Robert
    Mangolini, Filippo
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2022, 40 (05):
  • [3] Particular artifacts of topographic images of dielectrics in atomic-force microscopy
    Tolstikhina, A. L.
    Gainutdinov, R. V.
    Zanaveskin, M. L.
    Sorokina, K. L.
    Belugina, N. V.
    Grishchenko, Yu. V.
    CRYSTALLOGRAPHY REPORTS, 2007, 52 (05) : 894 - 900
  • [4] Particular artifacts of topographic images of dielectrics in atomic-force microscopy
    A. L. Tolstikhina
    R. V. Gaĭnutdinov
    M. L. Zanaveskin
    K. L. Sorokina
    N. V. Belugina
    Yu. V. Grishchenko
    Crystallography Reports, 2007, 52 : 894 - 900
  • [5] Influence of gains on the quality of topographic images based on atomic force microscopy
    Key Laboratory of Micro-Nano Materials for Energy Storage and Conversion of Henan Province, Institute of Surface Micro and Nano Materials, Xuchang University, Xuchang, China
    J. Adv. Microso. Res., 1 (50-53):
  • [6] Calibration of friction force signals in atomic force microscopy in liquid media
    Tocha, Ewa
    Song, Jing
    Schonherr, Holger
    Vancso, G. Julius
    LANGMUIR, 2007, 23 (13) : 7078 - 7082
  • [7] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES
    MARTI, O
    DRAKE, B
    HANSMA, PK
    APPLIED PHYSICS LETTERS, 1987, 51 (07) : 484 - 486
  • [8] Perspectives Toward an Integrative Structural Biology Pipeline With Atomic Force Microscopy Topographic Images
    Pellequer, Jean-Luc
    JOURNAL OF MOLECULAR RECOGNITION, 2024, 37 (06)
  • [9] Atomic force microscopy images obtained with C60 modified tips
    Kim, Sanghee
    Park, Sang-Kyu
    Park, Chan
    Jeon, Cheol II
    Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena, 1996, 14 (02):
  • [10] Atomic force microscopy images obtained with C-60 modified tips
    Kim, SH
    Park, SK
    Park, C
    Jeon, IC
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 1318 - 1321