Nuclear and electronic energy loss synergy in the process of damage growth in ion implanted LiNbO3

被引:14
作者
Bianconi, M.
Argiolas, N.
Bazzan, M.
Bentini, G. G.
Chiarini, M.
Cerutti, A.
Mazzoldi, P.
Pennestri, G.
Sada, C.
机构
[1] Sez Bologna, CNR, IMM, I-40139 Bologna, Italy
[2] INFM, I-35131 Padua, Italy
[3] Univ Padua, Dipartimento Fis, I-35131 Padua, Italy
[4] Carlo Gavazzi Space Spa, I-20151 Milan, Italy
关键词
ion implantation; lithium niobate; RBS channeling;
D O I
10.1016/j.nimb.2006.03.095
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The damage formation by implantation of energetic (similar to 5 MeV) low Z ions (C, N, O, F) in LiNbO3 has been investigated. The surface damage growth as a function of the fluence is consistent with a mechanism of nucleation and 3D growth of fully disordered clusters. It is possible to describe this behaviour by considering two processes: the first one is the direct generation of nuclear damage whereas the second one is the partial conversion of the electronic excitation into atomic displacements, mediated by the local concentration of defects. Within this simple scenario the damage evolution has been described by an analytical formula. This formula suggested that the existence of pre-damage in the surface region can boost the damage growth. This was demonstrated by introducing nuclear damage in the first 0.6 mu m surface layer by 500 keV O implantation followed by a subsequent 5 MeV O implantation. The final surface damage is not the mere sum of the two implantation steps, but it is strongly enhanced by the interaction of the two damage mechanisms (nuclear and electronic) and it is in very good quantitative agreement with the proposed analytical formula. A strong non-linear dependence of the electronic damage formation cross-section on the stopping power was evidenced by repeating the same experiment with carbon ions. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:122 / 125
页数:4
相关论文
共 17 条
[1]   Lattice preamorphization by ion irradiation:: Fluence dependence of the electronic stopping power threshold for amorphization -: art. no. 093514 [J].
Agulló-López, F ;
García, G ;
Olivares, J .
JOURNAL OF APPLIED PHYSICS, 2005, 97 (09)
[2]   Damage effects produced in the near-surface region of x-cut LiNbO3 by low dose, high energy implantation of nitrogen, oxygen, and fluorine ions [J].
Bentini, GG ;
Bianconi, M ;
Correra, L ;
Chiarini, M ;
Mazzoldi, P ;
Sada, C ;
Argiolas, N ;
Bazzan, M ;
Guzzi, R .
JOURNAL OF APPLIED PHYSICS, 2004, 96 (01) :242-247
[3]   Effect of low dose high energy O3+ implantation on refractive index and linear electro-optic properties in X-cut LiNbO3:: Planar optical waveguide formation and characterization [J].
Bentini, GG ;
Bianconi, M ;
Chiarini, M ;
Correra, L ;
Sada, C ;
Mazzoldi, P ;
Argiolas, N ;
Bazzan, M ;
Guzzi, R .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (11) :6477-6483
[4]   On the dynamics of the damage growth in 5 MeV oxygen-implanted lithium niobate -: art. no. 072901 [J].
Bianconi, M ;
Argiolas, N ;
Bazzan, M ;
Bentini, GG ;
Chiarini, M ;
Cerutti, A ;
Mazzoldi, P ;
Pennestrì, G ;
Sada, C .
APPLIED PHYSICS LETTERS, 2005, 87 (07)
[5]   Surface modifications of LiNbO3 single crystals induced by swift heavy ions [J].
Canut, B ;
Ramos, SMM ;
Brenier, R ;
Thevenard, P ;
Loubet, JL ;
Toulemonde, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 107 (1-4) :194-198
[6]  
Chen F, 2001, PHYS STATUS SOLIDI A, V187, P543, DOI 10.1002/1521-396X(200110)187:2<543::AID-PSSA543>3.0.CO
[7]  
2-M
[8]  
GOZT G, 1983, NUCL INSTRUM METHODS, V209, P1079
[9]   MODEL OF TEMPERATURE-DEPENDENT DEFECT INTERACTION AND AMORPHIZATION IN CRYSTALLINE SILICON DURING ION IRRADIATION [J].
HECKING, N ;
HEIDEMANN, KF ;
KAAT, ET .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 15 (1-6) :760-764
[10]   Monomode optical waveguide in lithium niobate formed by MeV Si+ ion implantation [J].
Hu, H ;
Lu, F ;
Chen, F ;
Shi, BR ;
Wang, KM ;
Shen, DY .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (09) :5224-5226