Simple method for measuring the linewidth enhancement factor of semiconductor lasers

被引：15

作者：

Fan, Yuanlong ^{[1
]}

Yu, Yanguang ^{[1
]}

Xi, Jiangtao ^{[1
]}

Rajan, Ginu ^{[1
]}

Guo, Qinghua ^{[1
]}

Tong, Jun ^{[1
]}

机构：

[1] Univ Wollongong, Sch Elect Comp & Telecommun Engn, Wollongong, NSW 2522, Australia

来源：

APPLIED OPTICS | 2015年 / 54卷 / 34期

关键词：

SELF-MIXING INTERFEROMETRY; EXTERNAL OPTICAL FEEDBACK; BROADENING FACTOR; PARAMETER; INJECTION; DIODE; THRESHOLD; CAVITY;

D O I：

10.1364/AO.54.010295

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A simple method for measuring the linewidth enhancement factor (LEF) of semiconductor lasers (SLs) is proposed and demonstrated in this paper. This method is based on the self-mixing effect when a small portion of optical signal intensity emitted by the SL reflected by the moving target re-enters the SL cavity, leading to a modulation in the SL's output power intensity, in which the modulated envelope shape depends on the optical feedback strength as well as the LEF. By investigating the relationship between the light phase and power from the well-known Lang and Kobayashi equations, it was found that the LEF can be simply measured from the power value overlapped by two SLs' output power under two different optical feedback strengths. Our proposed method is verified by both simulations and experiments. (C) 2015 Optical Society of America

引用

页码：10295 / 10298

页数：4

共 25 条

[1]

[Anonymous], 2013, Semiconductor Lasers: Stability, Instability, and Chaos, DOI 10.1007/978-3-642-30147-6

[2] Displacement measurements using a self-mixing laser diode under moderate feedback [J].

Bes, Caroline ;

Plantier, Guy ;

Bosch, Thierry .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2006, 55 (04) :1101-1105

[3] Determining laser linewidth parameter from Hopf bifurcation minimum in lasers subject to optical injection [J].

Chlouverakis, KE ;

Al-Aswad, KM ;

Henning, ID ;

Adams, MJ .

ELECTRONICS LETTERS, 2003, 39 (16) :1185-1187

[4] LASER-DIODE FEEDBACK INTERFEROMETER FOR MEASUREMENT OF DISPLACEMENTS WITHOUT AMBIGUITY [J].

DONATI, S ;

GIULIANI, G ;

MERLO, S .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1995, 31 (01) :113-119

[5] Developing self-mixing interferometry for instrumentation and measurements [J].

Donati, Silvano .

LASER & PHOTONICS REVIEWS, 2012, 6 (03) :393-417

[6] Experiments on the linewidth-enhancement factor of a vertical-cavity surface-emitting laser [J].

Fordell, Thomas ;

Lindberg, Asa Marie .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 2007, 43 (01) :6-15

[7]

Giuliani G., 2005, QUANT EL LAS SCI C, V1012, P1014

[8] Gain Compression and Above-Threshold Linewidth Enhancement Factor in 1.3-μm InAs-GaAs Quantum-Dot Lasers [J].

Grillot, Frederic ;

Dagens, Beatrice ;

Provost, Jean-Guy ;

Su, Hui ;

Lester, Luke F. .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 2008, 44 (9-10) :946-951

[9] MEASUREMENTS OF THE SEMICONDUCTOR-LASER LINEWIDTH BROADENING FACTOR [J].

HENNING, ID ;

COLLINS, JV .

ELECTRONICS LETTERS, 1983, 19 (22) :927-929

[10]

Henry C., 1982, QUANTUM ELECT IEEE J, V18, P259

← 1 2 3 →