Domain evolution of tetragonal Pb(ZrxTi1-x) O3 piezoelectric thin films on SrTiO3 (100) surfaces: combined effects of misfit strain and Zr/Ti ratio

被引：22

作者：

Yu, Qi ^{[1
]}

Li, Jing-Feng ^{[1
]}

Zhu, Fang-Yuan ^{[1
]}

Li, Jiangyu ^{[2
]}

机构：

[1] Tsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China

[2] Univ Washington, Dept Mech Engn, Seattle, WA 98195 USA

来源：

JOURNAL OF MATERIALS CHEMISTRY C | 2014年 / 2卷 / 29期

基金：

美国国家科学基金会;

关键词：

ELECTRICAL-PROPERTIES; DOPED SRTIO3; WALL;

D O I：

10.1039/c4tc00643g

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A series of sol-gel-processed Pb(ZrxTi1-x)(0.98)Nb0.02O3 (x - 0.2, 0.3, 0.4, 0.52) piezoelectric films were epitaxially grown on (100) surfaces of Nb-doped SrTiO3 single-crystalline substrates to study the composition-dependent domain evolution and corresponding piezoelectricity. The transformation between the 90 degrees a and c domains throughout the tetragonal phase region, together with the variation of piezoelectric property under different excitation signals, were investigated by piezoresponse force microscopy. The observed domain evolution has been well explained by the combined effects of both misfit strain and tetragonality, depending on the Zr/Ti ratio.

引用

页码：5836 / 5841

页数：6

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