Basics of X-ray diffraction

被引：48

作者：

Stanjek, H ^{[1
]}

Häusler, W

机构：

[1] Rhein Westfal TH Aachen, Inst Mineral & Lagerstattenlehre, D-52056 Aachen, Germany

[2] Tech Univ Munich, Phys Dept E15, D-85747 Garching, Germany

来源：

HYPERFINE INTERACTIONS | 2004年 / 154卷 / 1-4期

关键词：

X-ray diffraction; Rietveld simulation; graphite; graphite clays; black pottery;

D O I：

10.1023/B:HYPE.0000032028.60546.38

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

X-ray diffraction ( XRD) is the most comprehensive tool to identify minerals in complex mineral assemblages. The method is briefly described with special emphasis on clay and ceramics. As an example, an investigation of graphite- containing pottery sherds by XRD is presented. By comparing the measured XRD data with the patterns simulated by the Rietveld method, the graphite content of such samples could be determined.

引用

页码：107 / 119

页数：13

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