Basics of X-ray diffraction

被引：45
作者：
Stanjek, H [1 ]
Häusler, W
机构：
[1] Rhein Westfal TH Aachen, Inst Mineral & Lagerstattenlehre, D-52056 Aachen, Germany
[2] Tech Univ Munich, Phys Dept E15, D-85747 Garching, Germany
来源：
HYPERFINE INTERACTIONS | 2004年 / 154卷 / 1-4期
关键词：
X-ray diffraction; Rietveld simulation; graphite; graphite clays; black pottery;
D O I：
10.1023/B:HYPE.0000032028.60546.38
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
X-ray diffraction ( XRD) is the most comprehensive tool to identify minerals in complex mineral assemblages. The method is briefly described with special emphasis on clay and ceramics. As an example, an investigation of graphite- containing pottery sherds by XRD is presented. By comparing the measured XRD data with the patterns simulated by the Rietveld method, the graphite content of such samples could be determined.
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页码：107 / 119
页数：13
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