X-ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films

被引：0

作者：

Boulle, A. ^{[1
]}

Legrand, C. ^{[2
]}

Guinebretiere, R. ^{[1
]}

Mercurio, J. P. ^{[2
]}

Dauger, A. ^{[1
]}

机构：

[1] CNRS UMR 6638, Sci Proc Ceram & Traitements Surface, F-87065 Limoges, France

[2] Fac Sci, F-87060 Limoges, France

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2000年 / 56卷

关键词：

X-ray diffraction; line profile analysis; Aurivillius compound;

D O I：

10.1107/S0108767300028294

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

o.m8.p2

引用

页码：S399 / S399

页数：1

共 6 条

[1]

AURIVILLIUS B, 1950, ARK KEMI, V1, P499

[2]

Boulle A., P 7 EPDIC

[3] Sol-gel fabrication of heteroepitaxial zirconia films on MgO(001) substrates [J].

Guinebretière, R ;

Dauger, A ;

Masson, O ;

Soulestin, B .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1999, 79 (07) :1517-1531

[4] Structural characterisation of sol-gel SrBi2Nb2O9 thin film deposited on (001) SrTiO3 single crystal [J].

Legrand, C ;

Yi, JH ;

Thomas, P ;

Guinebretiére, R ;

Mercurio, JP .

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 1999, 19 (6-7) :1379-1381

[5] Profile analysis in asymmetric powder diffraction with parallel beam geometry and Curved Position Sensitive detector [J].

Masson, O ;

Guinebretiere, R ;

Dauger, A .

EPDIC 5, PTS 1 AND 2, 1998, 278-2 :115-120

[6]

Wilson A.J.C., 1962, X-ray optics

← 1 →