Broadband measurement of ESD risetimes to distinguish between different discharge mechanisms

被引:24
作者
Bönisch, S
Pommerenke, D
Kalkner, W
机构
[1] Tech Univ Berlin, D-10587 Berlin, Germany
[2] Univ Missouri, Electromagnet Compatibil Lab, Rolla, MO 65409 USA
关键词
ESD discharge mechanisms; ESD risetimes; CMD testing; ESD reproductivity; arc formation; breakdown voltage; reproducibility; short gap; surface process;
D O I
10.1016/S0304-3886(02)00056-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Different discharge mechanisms are possible for electrostatic discharge below 2000 V breakdown voltage as a function of the parameters gap distance, breakdown voltage, electrode material and gas pressure. In this paper, risetime measurement data of electrostatic discharges, measured at about 8 GHz bandwidth, are presented as a function of these parameters. Electrode SEM photographs (scanning electron microscope) helps to understand the influence of electrode surface. This provides information about the development of ESD and helps to increase their reproducibility. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:363 / 383
页数:21
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