High-speed broadband FTIR system using MEMS

被引:24
作者
Ayerden, N. Pelin [1 ,2 ]
Aygun, Ugur [1 ]
Holmstrom, Sven T. S. [1 ]
Olcer, Selim [1 ]
Can, Basarbatu [1 ]
Stehle, Jean-Louis [3 ]
Urey, Hakan [1 ]
机构
[1] Koc Univ, Dept Elect Engn, TR-34450 Istanbul, Turkey
[2] Delft Univ Technol, Microelect Dept, NL-2628 CD Delft, Netherlands
[3] Semilab, H-1117 Budapest, Hungary
关键词
SPECTROSCOPY; MICROACTUATORS;
D O I
10.1364/AO.53.007267
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Current Fourier transform infrared spectroscopy (FTIR) systems have very good spectral resolution, but are bulky, sensitive to vibrations, and slow. We developed a new FTIR system using a microelectromechanical system (MEMS)-based lamellar grating interferometer that is fast, compact, and achromatic (i.e., does not require a beam splitter). The MEMS device has > 10 mm(2) active surface area, up to +/- 325 mu m mechanical displacement, and a 343 Hz resonant operation frequency. The system uses a 5 MHz bandwidth custom infrared (IR) detector and a small emission area custom blackbody source to achieve fast interferogram acquisition and compact form factor. Effects of lamellar grating period, detector size, laser reference, apodization, and averaging of data on the spectral resolution are discussed. The measurement time ranges from 1.5 to 100 ms depending on the averaging time. In the target range of 2.5-16 mu m (625- 4000 cm(-1)) a spectral resolution of 15-20 cm(-1) is demonstrated. The measurements are shown to be stable over a long time. (C) 2014 Optical Society of America
引用
收藏
页码:7267 / 7272
页数:6
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