A 1.8-v 700-Mb/s/pin 512-Mb DDR-II SDRAM with on-die termination and off-chip driver calibration

被引:19
作者
Yoo, CS [1 ]
Kyung, KH
Lim, KN
Lee, HC
Chai, JW
Heo, NW
Kim, CH
机构
[1] Hanyang Univ, Dept Elect & Comp Engn, Seoul 133791, South Korea
[2] Samsung Elect, DRAM Design 3, Kyonggi Do 445701, South Korea
关键词
CMOS; DDR-II; double data rate (DDR); DRAM; hierarchical I/O line; local sense amplifier; low voltage; off-chip driver; on-die termination; SDRAM;
D O I
10.1109/JSSC.2004.827806
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 512-Mb DDR-II SDRAM has achieved 700-Mb/s/pin operation at 1.8-V supply voltage with 0.12-mum DRAM process. The low supply voltage presents challenges in high data rate and signal integrity. Circuit techniques such as hierarchical I/O lines, local sense amplifier, and fully shielded data lines without area penalty have provided improved data access time and, thus, high data rate can be achieved. Off-chip driver with calibrated strength and on-die termination are utilized to give sufficient signal integrity for over 533-Mb/s/pin operation.
引用
收藏
页码:941 / 951
页数:11
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