X-ray Bragg diffraction in asymmetric backscattering geometry

被引:46
|
作者
Shvyd'ko, Yu. V.
Lerche, M.
Kuetgens, U.
Rueter, H. D.
Alatas, A.
Zhao, J.
机构
[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
[2] Univ Illinois, Urbana, IL 61801 USA
[3] PTB, D-38116 Braunschweig, Germany
[4] Univ Hamburg, Inst Expt Phys, D-22761 Hamburg, Germany
关键词
D O I
10.1103/PhysRevLett.97.235502
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We observe three effects in the Bragg diffraction of x rays in backscattering geometry from asymmetrically cut crystals. First, exact Bragg backscattering takes place not at normal incidence to the reflecting atomic planes. Second, a well-collimated (similar or equal to 1 mu rad) beam is transformed after the Bragg reflection into a strongly divergent beam (230 mu rad) with reflection angle dependent on x-ray wavelength-an effect of angular dispersion. The asymmetrically cut crystal thus behaves like an optical prism, dispersing an incident collimated polychromatic beam. The dispersion rate is similar or equal to 8.5 mrad/eV. Third, parasitic Bragg reflections accompanying Bragg backreflection are suppressed. These effects offer a radically new means for monochromatization of x rays not limited by the intrinsic width of the Bragg reflection.
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页数:4
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