Smooth growth, characterization and optical properties of Cu2SnS3 thin film via spray pyrolysis method

被引：6

作者：

Nabi, Ghulam ^{[1
,2
]}

Amin, Farrukh ^{[1
]}

Jacob, Jolly ^{[3
]}

Tahir, M. Bilal ^{[1
]}

Tanveer, Muhammad ^{[1
]}

Usman, Zahid ^{[2
,4
]}

Hussain, S. ^{[2
,4
]}

机构：

[1] Univ Gujrat, Dept Phys, Nanotechnol Lab, Gujrat 50700, Pakistan

[2] Beijing Inst Technol, Res Ctr Mat Sci, Beijing 100081, Peoples R China

[3] Abu Dhabi Univ, Coll Arts & Sci, Abu Dhabi, U Arab Emirates

[4] Univ Educ, Div Sci & Technol, Dept Phys, Lahore, Pakistan

来源：

PHYSICA B-CONDENSED MATTER | 2021年 / 602卷

关键词：

Thin film; Spray pyrolysis; Bandgap; Optical properties; IONIC LAYER ADSORPTION; SOLAR-CELL; SULFURIZATION; FABRICATION;

D O I：

10.1016/j.physb.2020.412498

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Simple, low cost spray pyrolysis technique is implemented herein to deposit thin film of Cu2SnS3 on a glass substrate for photovoltaic applications. Structural, physical, chemical and optical properties of the thin film were analyzed by XRD, SEM, AFM and UV-VIS spectroscopy. The XRD pattern indicated tetragonal phase of the deposited Cu2SnS3 thin film having major XRD peaks at 2 theta of 28.54 degrees, 33.07 degrees and 47.47 degrees corresponding to the (112), (200), and (220) planes. It was inferred from SEM and AFM micrographs that the surface was smooth without any pinholes or cracks. The root mean square value of film surface roughness was found to be 11.74 nm and film thickness was measured 200 nm. The AFM and SEM results indicated that the deposited thin film was densely packed and strongly adhered to the substrate. The energy band gap of the deposited Cu2SnS3 thin film was found to be 1.6eV via UV-Vis spectroscopy.

引用

页数：6

共 35 条

[1] Preparation and characterization of Cu2SnS3 ternary semiconductor nanostructures via the spray pyrolysis technique for photovoltaic applications [J].