Development of Sn-Ag-Cu and Sn-Ag-Cu-X alloys for Pb-free electronic solder applications

被引:206
作者
Anderson, Iver E. [1 ]
机构
[1] Iowa State Univ, Ames Lab, US DOE, Ames, IA 50011 USA
关键词
D O I
10.1007/s10854-006-9011-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The global electronic assembly community is striving to accommodate the replacement of Pb-containing solders, primarily Sn-Pb alloys, with Pb-free solders due to environmental regulations and market pressures. Of the Pb-free choices, a family of solder alloys based on the Sn-Ag-Cu (SAC) ternary eutectic (T-eut. = 217 degrees C) composition have emerged with the most potential for broad use across the industry, but the preferred (typically near-eutectic) composition is still in debate. This review will attempt to clarify the characteristic microstructures and mechanical properties of the current candidates and recommend alloy choices, a maximum operating temperature limit, and directions for future work. Also included in this review will be an exploration of several SAC + X candidates, i.e., 4th element modifications of SAC solder alloys, that are intended to control solder alloy undercooling and solidification product phases and to improve the resistance of SAC solder joints to high temperature thermal aging effects. Again, preliminary alloy recommendations will be offered, along with suggestions for future work.
引用
收藏
页码:55 / 76
页数:22
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