Heterojunctions and superlattices based on silicon carbide

被引:144
作者
Lebedev, A. A. [1 ]
机构
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
关键词
D O I
10.1088/0268-1242/21/6/R01
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In addition to possessing unique electrical properties, silicon carbide (SiC) can crystallize in different modifications (polytypes). Having the same chemical nature, SiC polytypes may significantly differ in their electrical parameters. In recent years, the world's interest in the fabrication and study of heteropolytype structures based on silicon carbide has considerably increased. This review considers studies concerned with polytypism in SiC, fabrication technologies of various types of heterostructures constituted by different SiC polytypes and their electrical parameters. It is shown that heterostructures between SiC polytypes may have a better structural perfection than those constituted by semiconductors that differ in chemical nature. A conclusion is made that SiC-based heterostructures are promising for application in modern electronic devices.
引用
收藏
页码:R17 / R34
页数:18
相关论文
共 136 条
[41]   Molecular beam epitaxy of semiconductor nanostructures based on SiC [J].
Fissel, A .
SILICON CARBIDE AND RELATED MATERIALS 2004, 2005, 483 :163-168
[42]   Artificially layered heteropolytypic structures based on SiC polytypes: molecular beam epitaxy, characterization and properties [J].
Fissel, A .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 2003, 379 (3-4) :149-255
[43]   MBE growth and properties of SiC multi-quantum well structures [J].
Fissel, A ;
Kaiser, U ;
Schröter, B ;
Richter, W ;
Bechstedt, F .
APPLIED SURFACE SCIENCE, 2001, 184 (1-4) :37-42
[44]   High-quality SIC epitaxial layers and low-dimensional heteropolytypic SIC structures grown by solid-source MBE [J].
Fissel, A .
JOURNAL OF CRYSTAL GROWTH, 2001, 227 :805-810
[45]   On the nature of the D1-defect center in SiC:: A photoluminescence study of layers grown by solid-source molecular-beam epitaxy [J].
Fissel, A ;
Richter, W ;
Furthmüller, J ;
Bechstedt, F .
APPLIED PHYSICS LETTERS, 2001, 78 (17) :2512-2514
[46]  
FRANK FC, 1951, PHILOS MAG, V42, P1014
[47]   Recombination-enhanced extension of stacking faults in 4H-SiC p-i-n diodes under forward bias [J].
Galeckas, A ;
Linnros, J ;
Pirouz, P .
APPLIED PHYSICS LETTERS, 2002, 81 (05) :883-885
[48]  
Goldberg Yu., 2001, Properties of Advanced Semiconductor Materials: GaN, AIN, InN, BN, SiC, SiGe
[49]   Determination of the polarization dependence of the free-carrier-absorption in 4H-SiC at high-level photoinjection [J].
Grivickas, V ;
Galeckas, A ;
Grivickas, P ;
Linnros, J .
SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, 2000, 338-3 :555-558
[50]   Direct transformation of cubic diamond to hexagonal diamond [J].
He, HK ;
Sekine, T ;
Kobayashi, T .
APPLIED PHYSICS LETTERS, 2002, 81 (04) :610-612