Code-coverage guided prioritized test generation

被引:25
作者
Li, J. Jenny
Weiss, David
Yee, Howell
机构
[1] Avaya Labs Res, Software Technol Res, Basking Ridge, NJ 07920 USA
[2] MIT, Lincoln Lab, Lexington, MA 02420 USA
关键词
D O I
10.1016/j.infsof.2006.06.007
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Most automatic test generation research focuses on generation of test data from pre-selected program paths or input domains or program specifications. This paper presents a methodology for a full solution to code-coverage-based test case generation, which includes code coverage-based path selection, test data generation and actual test case representation in program's original languages. We implemented this method in an automatic testing framework, eXVantage. Experimental results and industrial trials show that the framework is able to generate tests to achieve program line coverage from 20% to 98% with reduced overall testing effort. Our major contributions include an innovative coverage-based program prioritization algorithm, a novel path selection algorithm that takes into consideration program priority and functional calling relationship, and a constraint solver for test data generation that derives constraints from byte-code and solves complex constraints involving strings and dynamic objects. (C) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1187 / 1198
页数:12
相关论文
共 22 条
  • [1] Mining system tests to aid software maintenance
    Agrawal, H
    Albert, JL
    Horgan, JR
    Li, JJ
    London, S
    Wong, WE
    Ghosh, S
    Wilde, N
    [J]. COMPUTER, 1998, 31 (07) : 64 - +
  • [2] [Anonymous], 1999, P 2 C COMPUTER SCI E
  • [3] [Anonymous], P 4 SDL FOR LOSB POR
  • [4] BEYDEDA S, 2003, COMP SOFTW APPL C CO
  • [5] Clarke L. A., 1976, IEEE Transactions on Software Engineering, VSE-2, P215, DOI 10.1109/TSE.1976.233817
  • [6] The AETG system: An approach to testing based on combinatorial design
    Cohen, DM
    Dalal, SR
    Fredman, ML
    Patton, GC
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1997, 23 (07) : 437 - 444
  • [7] Cormen T. H., Introduction to Algorithms, V2nd
  • [8] Generating test data for branch coverage
    Gupta, N
    Mathur, AP
    Soffa, ML
    [J]. FIFTEENTH IEEE INTERNATIONAL CONFERENCE ON AUTOMATED SOFTWARE ENGINEERING, PROCEEDINGS, 2000, : 219 - 227
  • [9] HARTMANN J, 2000, P INT S SOFTW TEST A, P60
  • [10] SYMBOLIC TESTING AND DISSECT SYMBOLIC EVALUATION SYSTEM
    HOWDEN, WE
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1977, 3 (04) : 266 - 278