Charge kinetics in spinel and yttria-stabilized zirconia

被引:5
作者
Boughariou, Aicha [1 ]
Karray, Fekri [1 ]
Kallel, Ali [1 ]
Blaise, Guy [2 ]
机构
[1] Univ Sfax, Fac Sci, LaMaCoP, Sfax 3038, Tunisia
[2] Univ Paris 11, LPS, F-91405 Orsay, France
关键词
Spinel; Zirconia; The total secondary electron emission; Trapper insulator; Conductive insulator; ELECTRON; INSULATORS;
D O I
10.1016/j.apsusc.2008.11.074
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Spinel and zirconia were studied by measuring the total secondary electron emission (SEE) yield sigma in a dedicated scanning electron microscope ( SEM) especially equipped to study the fundamental aspects of the charge trapping in insulating materials during a 1.1 keV electron irradiation at room temperature. The variation of the total SEE yield with the injected dose for both spinel and zirconia is different. In spinel the coefficient s starts from its intrinsic value sigma(0) = 4 and reaches a plateau at sigma = 1 at the end of irradiation, which corresponds to the self-regulated regime. The continuity of the curves, shot after shot, proves that the trapped charges are stable and does not spread out in the material as injection proceeds. In this case spinel is called "trapper insulator''. In contrast with the spinel, sigma in zirconia, never reaches unity while the injected charge increases: it evolves from its intrinsic yield sigma(0) = 2.3 to a steady value a few percent above 1. The curve shows the relaxation of the positive generated charge. In this case zirconia is called "conductive insulator''. The difference in the charging kinetics of the two materials is attributed to the difference in conductivities. (C) 2008 Elsevier B. V. All rights reserved.
引用
收藏
页码:4779 / 4781
页数:3
相关论文
共 10 条
[1]   Time-dependent measurement of the trapped charge in electron irradiated insulators:: Application to Al2O3-sapphire [J].
Belhaj, M ;
Odof, S ;
Msellak, K ;
Jbara, O .
JOURNAL OF APPLIED PHYSICS, 2000, 88 (05) :2289-2294
[2]  
BLAISE G, 2001, P 4 INT C EL CHARG N, P326
[3]   Effect of current density on electron beam induced charging in MgO [J].
Boughariou, A ;
Hachicha, F ;
Kallel, A ;
Blaise, G .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 240 (03) :697-703
[4]   Charge dynamics of MgO single crystals subjected to KeV electron irradiation [J].
Boughariou, A ;
Blaise, G ;
Braga, D ;
Kallel, A .
JOURNAL OF APPLIED PHYSICS, 2004, 95 (08) :4117-4124
[5]  
BRAGA D, 2003, IMAGING MICROSC, P28
[6]   SOME PHYSICAL DESCRIPTIONS OF THE CHARGING EFFECTS OF INSULATORS UNDER INCIDENT PARTICLE BOMBARDMENT [J].
CAZAUX, J ;
LEHUEDE, P .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1992, 59 (01) :49-71
[7]   Dynamic investigation of electron trapping and charge decay in electron-irradiated Al2O3 in a scanning electron microscope:: Methodology and mechanisms [J].
Fakhfakh, S ;
Jbara, O ;
Belhaj, M ;
Fakhfakh, Z ;
Kallel, A ;
Rau, EI .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2002, 197 (1-2) :114-127
[8]   The impact of YSZ surface steps on structure and morphology of La2Zr2O7 islands growing on YSZ(100) surfaces by vapour-solid reaction [J].
Lu, CJ ;
Senz, S ;
Hesse, D .
SURFACE SCIENCE, 2002, 515 (2-3) :507-516
[9]  
Reimer L., 1985, SCANNING ELECT MICRO, DOI DOI 10.1007/978-3-540-38967-5
[10]  
RENOUD R, 2001, CSC 4 P S, P376