A low-temperature route to nanocrystalline boron nitride whiskers and flakes

被引：27

作者：

Chen, LY

Huang, MX

Luo, T

Gu, YL

Shi, L

Yang, ZH

Qian, YT ^{[1
]}

机构：

[1] Univ Sci & Technol China, Dept Chem, Hefei 230026, Anhui, Peoples R China

[2] Univ Sci & Technol China, Struct Res Lab, Hefei 230026, Anhui, Peoples R China

来源：

MATERIALS LETTERS | 2004年 / 58卷 / 27-28期

基金：

中国国家自然科学基金;

关键词：

X-ray diffraction; whiskers; boron nitride;

D O I：

10.1016/j.matlet.2004.07.009

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Nanocrystalline boron nitride (BN) was prepared by the reaction of BBr3 and Mg3N2 at 400 degreesC. X-ray powder diffraction (XRD) patterns can be indexed as hexagonal BN with the lattice constants of a = 2.504 and c = 6.671 Angstrom. The transmission electron microscopy (TEM) images showed whisker-like and flake-like morphology. The product was also characterized by X-ray photoelectron spectrum (XPS) and Fourier transformation infrared spectroscopy (FTIR). (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：3634 / 3636

页数：3

共 15 条

[1]

BARTNITSKAYA TS, 1990, POROSHK METALL KIEV, V12, P55

[2] CHARACTERIZATION OF BORON-NITRIDE FILMS DEPOSITED FROM BCL3-NH3-H-2 MIXTURES IN CHEMICAL-VAPOR INFILTRATION CONDITIONS [J].