Characterization and CMRR Modeling of a Carbon-Nanotube Field-Emission Differential Amplifier

被引：3

作者：

Wong, Yong Mui ^{[1
]}

Kang, Weng Poo ^{[1
]}

Davidson, Jimmy L. ^{[1
]}

Kerns, David V., Jr. ^{[2
]}

Huang, J. H. ^{[3
]}

Galloway, Kenneth F. ^{[1
]}

机构：

[1] Vanderbilt Univ, Dept Elect & Comp Engn, Nashville, TN 37235 USA

[2] Olin Coll Engn, Needham, MA 02492 USA

[3] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 2009年 / 56卷 / 05期

关键词：

Carbon nanotube (CNT); differential amplifier (diff-amp); field emission; integrated circuits (ICs); TRANSISTOR CHARACTERISTICS; DIAMOND; TRIODE; EMITTERS;

D O I：

10.1109/TED.2009.2015418

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel vacuum field-emission differential amplifier (diff-amp) based on carbon-nanotube (CNT) emitters has been developed, modeled, and its ac performance characterized. A dual-mask microfabrication process was employed to achieve a single-chip diff-amp by integrating matched CNT field-emission triodes with built-in split gates and integrated anodes. The identical pair of triode amplifiers was well matched in device characteristics. The measured ac common-mode-rejection ratio (CMRR) of the diff-amp was similar to 50 dB. The proposed CMRR semianalytical model was validated with the experimental data. The successful implementation of the CNT diff-amp demonstrates a new way to achieve high-temperature and radiation-tolerant vacuum integrated circuits.

引用

页码：738 / 743

页数：6

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