Characteristic analysis of nanosilicon rectangular waveguides for planar light-wave circuits of high integration

被引:50
作者
Dai, Daoxin [1 ]
Shi, Yaocheng
He, Sailing
机构
[1] Zhejiang Univ, Ctr Opt Electromagnet Res, State Key Lab Modern Opt & Instrumentat, Hangzhou 310058, Peoples R China
[2] Royal Inst Technol, Joint Res Ctr Photon, Stockholm, Sweden
[3] Royal Inst Technol, Div Electromagnet Theory, Alfven Lab, S-10044 Stockholm, Sweden
关键词
D O I
10.1364/AO.45.004941
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
When a full-vectorial finite-difference method is used, rectangular Si waveguides can be characterized for planar light-wave circuits of high integration. The single-mode condition for a rectangular Si waveguide is obtained first. The birefringence, which can be adjusted by modifying the thickness of the cladding layer, is also studied. For a nano-Si rectangular waveguide the pure bending loss is very small even for an ultrasmall bending radius (e.g., a few micrometers), and the transition loss becomes dominant. The width and height are optimized to minimize the bending radius for the requirement that the bending loss is smaller than 0.1 dB. Finally the coupling between two parallel straight waveguides is analyzed, and it is shown that there is an optimal width for the maximal coupling length. (C) 2006 Optical Society of America.
引用
收藏
页码:4941 / 4946
页数:6
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