Electron spin resonance of substitutional nitrogen in silicon

被引:8
作者
Belli, M. [1 ]
Fanciulli, M. [1 ,2 ]
Batani, D. [3 ,4 ]
机构
[1] IMM CNR, Lab MDM, I-20864 Agrate Brianza, MB, Italy
[2] Univ Milano Bicocca, Dipartmento Sci Mat, I-20126 Milan, Italy
[3] Univ Bordeaux, CEA, CNRS, CELIA Ctr Laser Intense Applicat,UMR 5107, F-33405 Talence, France
[4] Univ Milano Bicocca, Dipartmento Fis, I-20126 Milan, Italy
关键词
OFF-CENTER IMPURITIES; MAGNETIC-RESONANCE; PARAMAGNETIC-RES; DEFECTS; DONORS; RELAXATION; SHALLOW; STRESS; SPECTROSCOPY; CENTERS;
D O I
10.1103/PhysRevB.89.115207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The development of silicon-based nanoscale technology for the realization of single electron, single spin quantum devices demands deep donor-based systems to achieve a major breakthrough in the field: high-temperature operation. Here, we suggest that, despite some preparation difficulties, substitutional nitrogen in silicon (N-Si) represents an interesting candidate for this purpose, being observable by electron paramagnetic resonance (EPR) at room temperature. We report a study of the nature and dynamics of substitutional nitrogen in silicon, the so-called SL5 paramagnetic center, by X-band continuous-wave EPR, complemented by pulsed EPR. Both natural and Si-28 isotopically enriched nitrogen-doped silicon samples have been used, the latter providing an improvement in the accuracy of the spin Hamiltonian parameters.
引用
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页数:8
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