Interfacial Reactions in the Cu/Ga/Co and Cu/Ga/Ni Samples

被引:21
作者
Chen, Sinn-wen [1 ,2 ]
Lin, Ji-min [1 ]
Yang, Tsu-ching [1 ]
Du, Yi-huei [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Chem Engn, Hsinchu, Taiwan
[2] Natl Tsing Hua Univ, High Entropy Mat Ctr, Hsinchu, Taiwan
关键词
Solid-liquid interdiffusion (SLID); interfacial reaction; Ga; Cu; Co; Ni; RENEWABLE ENERGY; THERMOELECTRICS; GALLIUM;
D O I
10.1007/s11664-019-07121-w
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To fundamentally understand the solid-liquid interdiffusion joining processes between a Cu electrode and Co and Ni barrier layers using a Ga solder, the interfacial reactions in the Cu/Ga, Co/Ga, Ni/Ga, Cu/Ga/Co and Cu/Ga/Ni samples have been systematically examined. The reaction phases at the Cu/Ga interface in the Cu/Ga, Cu/Ga/Co and Cu/Ga/Ni samples reacted at 200 degrees C, 350 degrees C and 500 degrees C are all the same, and are (3)-Cu9Ga4 and CuGa2, (2)-Cu9Ga4 and (1)-Cu9Ga4 respectively. No Co/Ga interfacial reaction phase was found in either the Co/Ga or Cu/Ga/Co samples reacted at 200 degrees C, and the reaction phase is CoGa3 when reacted at 350 degrees C and 500 degrees C. The reaction phase in the Ni/Ga couples reacted at 200 degrees C and 350 degrees C is the Ni3Ga7 phase while it is Ni2Ga3 at 500 degrees C. In the Cu/Ga/Ni samples, no Ni/Ga interfacial reaction phase is observed at 200 degrees C, and the Ni3Ga7 and Ni2Ga3 phases formed at 350 degrees C and 500 degrees C have 8.5 at.%Cu and 14.0 at.%Cu solubilities. The growth rates of the reaction phases have been determined, and the Ga consumption rates in the Cu/Ga/Co and Cu/Ga/Ni samples at 200 degrees C, 350 degrees C and 500 degrees C were calculated. It is observed that the consumption rates increase with the square root of the reaction time, and the consumption rate constants are 39.2 m/h(0.5) and 77.3 m/h(0.5), respectively.
引用
收藏
页码:3643 / 3654
页数:12
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