Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow - An introduction

被引：9

作者：

Colliex, Christian ^{[1
]}

机构：

[1] Univ Paris 11, Phys Solides Lab, UMR CNRS 8502, F-91405 Orsay, France

来源：

COMPTES RENDUS PHYSIQUE | 2014年 / 15卷 / 2-3期

关键词：

Transmission electron microscopy; Signal generation and recording; Aberration correction; Nano laboratory; ENERGY-LOSS SPECTROSCOPY; CHEMICAL-ANALYSIS; SINGLE ATOMS; RESOLUTION; VOLTAGE; LIQUID; GROWTH; CARBON; OXYGEN; BEAMS;

D O I：

10.1016/j.crhy.2014.02.001

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

This dossier in Comptes rendus Physique is devoted to the most recent technologies and methodologies in electron microscopy available in 2014, which have provided this instrument with unique capabilities for atomic-level investigations in the domain of materials science. The present introduction provides some basic information required for an easier reading of the following manuscripts. It therefore focuses on column design, signal acquisition strategy, aberration correction, resolving power, in situ experiments and novel approaches, illustrated with a description of a few of their present and future fields of use. (C) 2014 Academie des sciences. Published by Elsevier Masson SAS. All rights reserved.

引用

页码：101 / 109

页数：9

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