The effect of annealing temperature on structural, morphological and optical properties of CdZnTe thin films

被引：19

作者：

Vidhya, S. N. ^{[1
]}

Balasundaram, O. N. ^{[2
]}

Chandramohan, M. ^{[1
]}

机构：

[1] RVS Tech Campus Coimbatore, Dept Phys, Coimbatore 641402, Tamil Nadu, India

[2] PSG Coll Arts & Sci, Dept Phys, Coimbatore 641014, Tamil Nadu, India

来源：

OPTIK | 2015年 / 126卷 / 24期

关键词：

Thin films; Chemical bath; Structural properties; Optical properties; ELECTROCHEMICAL GROWTH; ALLOY;

D O I：

10.1016/j.ijleo.2015.09.032

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Cadmium zinc telluride (CdZnTe) thin films were grown on glass substrates by the chemical bath deposition. The films were annealed in air for 1 h at various temperatures (300 degrees C, 400 degrees C and 500 degrees C). The grown films were analyzed by X-ray diffraction, scanning electron microscopy and UV spectra. X-ray diffraction studies reveal that films are polycrystalline in nature with rhombohedral structure. The structural parameters such as grain size, dislocation density and micro strain were evaluated. SEM analysis at high temperature indicates the hexagonal face like rod structure. Optical transmittance study shows the wide transmittance with the band gap energy decreasing, from 2 to 1.75 eV. (C) 2015 Elsevier GmbH. All rights reserved.

引用

页码：5460 / 5463

页数：4

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