The micro-imaging station of the TopoTomo beamline at the ANKA synchrotron light source

被引：102

作者：

Rack, A. ^{[1
]}

Weitkamp, T. ^{[1
]}

Trabelsi, S. Bauer ^{[1
]}

Modregger, P. ^{[1
]}

Cecilia, A. ^{[1
]}

Rolo, T. dos Santos ^{[1
]}

Rack, T. ^{[1
]}

Haas, D. ^{[1
]}

Simon, R. ^{[1
]}

Heldele, R. ^{[2
]}

Schulz, M. ^{[2
]}

Mayzel, B. ^{[3
]}

Danilewsky, A. N. ^{[4
]}

Waterstradt, T. ^{[5
]}

Diete, W. ^{[5
]}

Riesemeier, H. ^{[6
,7
,8
]}

Mueller, B. R. ^{[6
,7
,8
]}

Baumbach, T. ^{[1
]}

机构：

[1] Forschungszentrum Karlsruhe KIT, Inst Synchrotron Radiat ANKA, Karlsruhe, Germany

[2] Forschungszentrum Karlsruhe KIT, Inst Mat Res 3, Karlsruhe, Germany

[3] Tel Aviv Univ, Fac Life Sci, Tel Aviv, Israel

[4] Univ Freiburg, Inst Geowissensch, D-7800 Freiburg, Germany

[5] ACCEL Instruments GmbH, Bergisch Gladbach, Germany

[6] Bundesanstalt Mat Forsch & Prufung, Div Struct Anal, D-1000 Berlin, Germany

[7] Bundesanstalt Mat Forsch & Prufung, Div Polymer Anal 1 3, D-1000 Berlin, Germany

[8] Bundesanstalt Mat Forsch & Prufung, Div Radiol Methods 8 3, D-1000 Berlin, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2009年 / 267卷 / 11期

关键词：

Micro-tomography; Synchrotron instrumentation; Coherent imaging; X-ray phase contrast; Synchrotron-CT; Scintillator; Bragg magnification; Analyzer-based imaging; X-ray topography; X-RAY MICROTOMOGRAPHY; DOUBLE-MULTILAYER MONOCHROMATOR; SPATIOTEMPORAL MICRO-RESOLUTION; PHASE-CONTRAST MICROTOMOGRAPHY; COMPUTED MICROTOMOGRAPHY; RADIATION; DIFFRACTION; TOMOGRAPHY; BAMLINE; SCINTILLATOR;

D O I：

10.1016/j.nimb.2009.04.002

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The TopoTomo bending magnet beamline at the ANKA synchrotron facility in Karlsruhe (Germany) operates in the hard X-ray regime (above 6 keV). Recently, an X-ray micro-imaging station has been installed at TopoTomo. For typical imaging applications, a filtered white beam or from 2009 on a double-multilayer monochromator is used. In order to optimize the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 14-bit dynamic range CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. Due to the moderate flux of the beamline compared to insertion-device beamlines on third generation light sources, special emphasis has been put on the efficiency of the detectors via a dedicated scintillator concept. The layout of the beamline optics makes optimal use of the coherence properties. Thus, absorption contrast, phase-contrast and analyzer-based imaging can be applied. Additionally, white beam synchrotron topography is performed, using digital indirect X-ray pixel detectors as well as X-ray film. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：1978 / 1988

页数：11

共 94 条

[11] Diffraction enhanced x-ray imaging [J].

Chapman, D ;

Thomlinson, W ;

Johnston, RE ;

Washburn, D ;

Pisano, E ;

Gmur, N ;

Zhong, Z ;

Menk, R ;

Arfelli, F ;

Sayers, D .

PHYSICS IN MEDICINE AND BIOLOGY, 1997, 42 (11) :2015-2025

[12] Performance of a double-multilayer monochromator at Beamline 2-BM at the Advanced Photon Source [J].

Chu, YS ;

Liu, C ;

Mancini, DC ;

De Carlo, F ;

Macrander, AT ;

Lai, B ;

Shu, D .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (03) :1485-1487

[13] Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays [J].

Cloetens, P ;

Ludwig, W ;

Baruchel, J ;

Van Dyck, D ;

Van Landuyt, J ;

Guigay, JP ;

Schlenker, M .

APPLIED PHYSICS LETTERS, 1999, 75 (19) :2912-2914

[14] Phase objects in synchrotron radiation hard x-ray imaging [J].

Cloetens, P ;

Barrett, R ;

Baruchel, J ;

Guigay, JP ;

Schlenker, M .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1996, 29 (01) :133-146

[15] White beam topography of 300 mm Si wafers [J].

Danilewsky, A. N. ;

Wittge, J. ;

Rack, A. ;

Weitkamp, T. ;

Simon, R. ;

Baumbach, T. ;

McNally, P. .

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2008, 19 (Suppl 1) :S269-S272

[16] White beam synchrotron topography using a high resolution digital X-ray imaging detector [J].

Danilewsky, A. N. ;

Rack, A. ;

Wittge, J. ;

Weitkamp, T. ;

Simon, R. ;

Riesemeier, H. ;

Baumbach, T. .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2008, 266 (09) :2035-2040

[17] White beam x-ray topography at the synchrotron light source ANKA, Research Centre Karlsruhe [J].

Danilewsky, AN ;

Simon, R ;

Fauler, A ;

Fiederle, M ;

Benz, KW .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 199 :71-74

[18] Fabrication of diffraction gratings for hard X-ray phase contrast imaging [J].

David, C. ;

Bruder, J. ;

Rohbeck, T. ;

Gruenzweig, C. ;

Kottler, C. ;

Diaz, A. ;

Bunk, O. ;

Pfeiffer, F. .

MICROELECTRONIC ENGINEERING, 2007, 84 (5-8) :1172-1177

[19] Differential x-ray phase contrast imaging using a shearing interferometer [J].

David, C ;

Nöhammer, B ;

Solak, HH ;

Ziegler, E .

APPLIED PHYSICS LETTERS, 2002, 81 (17) :3287-3289

[20] Status of XOP:: an x-ray optics software toolkit [J].

del Río, MS ;

Dejus, RJ .

ADVANCES IN COMPUTATIONAL METHODS FOR X-RAY AND NEUTRON OPTICS, 2004, 5536 :171-174

← 1 2 3 4 5 6 7 8 9 10 →