Line widths of single-electron tunneling oscillations: Experiment and numerical simulations

被引：0
作者：
Bylander, Jonas [1 ]
Duty, Tim [1 ]
Delsing, Per [1 ]
机构：
[1] Chalmers, Dept Microtechnol & Nanosci, SE-41296 Gothenburg, Sweden
来源：
LOW TEMPERATURE PHYSICS, PTS A AND B | 2006年 / 850卷
关键词：
coulomb blockade; single-electron tunneling; SET; array of tunnel junctions; time correlation; RF-SET;
D O I：
暂无
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
We present experimental and numerical results from a real-time detection of time-correlated single-electron tunneling oscillations in a one-dimensional series array of small tunnel junctions. The electrons tunnel with a frequency f = I/e, where I is the current and e is the electron charge. Experimentally, we have connected a single-electron transistor to the last array island, and in this way measured currents from 5 fA to 1 pA by counting the single electrons. We find that the line width of the oscillation is proportional to the frequency f. The experimental data agrees well with numerical simulations.
引用
收藏
页码：1442 / +
页数：2
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