Line widths of single-electron tunneling oscillations: Experiment and numerical simulations

被引：0

作者：

Bylander, Jonas ^{[1
]}

Duty, Tim ^{[1
]}

Delsing, Per ^{[1
]}

机构：

[1] Chalmers, Dept Microtechnol & Nanosci, SE-41296 Gothenburg, Sweden

来源：

LOW TEMPERATURE PHYSICS, PTS A AND B | 2006年 / 850卷

关键词：

coulomb blockade; single-electron tunneling; SET; array of tunnel junctions; time correlation; RF-SET;

D O I：

暂无

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

We present experimental and numerical results from a real-time detection of time-correlated single-electron tunneling oscillations in a one-dimensional series array of small tunnel junctions. The electrons tunnel with a frequency f = I/e, where I is the current and e is the electron charge. Experimentally, we have connected a single-electron transistor to the last array island, and in this way measured currents from 5 fA to 1 pA by counting the single electrons. We find that the line width of the oscillation is proportional to the frequency f. The experimental data agrees well with numerical simulations.

引用

页码：1442 / +

页数：2

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