共 37 条
[1]
Scanning tunneling microscopy fingerprints of point defects in graphene: A theoretical prediction
[J].
Amara, H.
;
Latil, S.
;
Meunier, V.
;
Lambin, Ph.
;
Charlier, J.-C.
.
PHYSICAL REVIEW B,
2007, 76 (11)

Amara, H.
论文数: 0 引用数: 0
h-index: 0
机构: Fac Univ Notre Dame Paix, Phys Solide Lab, B-5000 Namur, Belgium

Latil, S.
论文数: 0 引用数: 0
h-index: 0
机构: Fac Univ Notre Dame Paix, Phys Solide Lab, B-5000 Namur, Belgium

Meunier, V.
论文数: 0 引用数: 0
h-index: 0
机构: Fac Univ Notre Dame Paix, Phys Solide Lab, B-5000 Namur, Belgium

Lambin, Ph.
论文数: 0 引用数: 0
h-index: 0
机构: Fac Univ Notre Dame Paix, Phys Solide Lab, B-5000 Namur, Belgium

Charlier, J.-C.
论文数: 0 引用数: 0
h-index: 0
机构: Fac Univ Notre Dame Paix, Phys Solide Lab, B-5000 Namur, Belgium
[2]
Toward Wafer Scale Fabrication of Graphene Based Spin Valve Devices
[J].
Avsar, Ahmet
;
Yang, Tsung-Yeh
;
Bae, Sukang
;
Balakrishnan, Jayakumar
;
Volmer, Frank
;
Jaiswal, Manu
;
Yi, Zheng
;
Ali, Syed Rizwan
;
Guentherodt, Gernot
;
Hong, Byung Hee
;
Beschoten, Bernd
;
Oezyilmaz, Barbaros
.
NANO LETTERS,
2011, 11 (06)
:2363-2368

Avsar, Ahmet
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Univ Singapore, Graphene Res Ctr, Singapore 117542, Singapore
Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Yang, Tsung-Yeh
论文数: 0 引用数: 0
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机构:
Rhein Westfal TH Aachen, Inst Phys 2, D-52074 Aachen, Germany
Julich Aachen Res Alliance, JARA Fundamentals Future Informat Technol, Aachen, Germany Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Bae, Sukang
论文数: 0 引用数: 0
h-index: 0
机构:
Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea
Sungkyunkwan Univ, Dept Chem, Ctr Human Interface Nanotechnol HINT, Suwon 440746, South Korea Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Balakrishnan, Jayakumar
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机构:
Natl Univ Singapore, Graphene Res Ctr, Singapore 117542, Singapore
Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Volmer, Frank
论文数: 0 引用数: 0
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机构:
Rhein Westfal TH Aachen, Inst Phys 2, D-52074 Aachen, Germany
Julich Aachen Res Alliance, JARA Fundamentals Future Informat Technol, Aachen, Germany Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Jaiswal, Manu
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Univ Singapore, Graphene Res Ctr, Singapore 117542, Singapore
Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Yi, Zheng
论文数: 0 引用数: 0
h-index: 0
机构:
Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea
Sungkyunkwan Univ, Dept Chem, Ctr Human Interface Nanotechnol HINT, Suwon 440746, South Korea
Natl Univ Singapore, Graphene Res Ctr, Singapore 117542, Singapore
Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Ali, Syed Rizwan
论文数: 0 引用数: 0
h-index: 0
机构:
Rhein Westfal TH Aachen, Inst Phys 2, D-52074 Aachen, Germany
Julich Aachen Res Alliance, JARA Fundamentals Future Informat Technol, Aachen, Germany Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Guentherodt, Gernot
论文数: 0 引用数: 0
h-index: 0
机构:
Rhein Westfal TH Aachen, Inst Phys 2, D-52074 Aachen, Germany
Julich Aachen Res Alliance, JARA Fundamentals Future Informat Technol, Aachen, Germany Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Hong, Byung Hee
论文数: 0 引用数: 0
h-index: 0
机构:
Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea
Sungkyunkwan Univ, Dept Chem, Ctr Human Interface Nanotechnol HINT, Suwon 440746, South Korea Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Beschoten, Bernd
论文数: 0 引用数: 0
h-index: 0
机构:
Rhein Westfal TH Aachen, Inst Phys 2, D-52074 Aachen, Germany
Julich Aachen Res Alliance, JARA Fundamentals Future Informat Technol, Aachen, Germany Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea

Oezyilmaz, Barbaros
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Univ Singapore, Graphene Res Ctr, Singapore 117542, Singapore
Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore
Natl Univ Singapore, Fac Engn, Singapore 117576, Singapore
NUS Grad Sch Integrat Sci & Engn NGS, Singapore 117456, Singapore Sungkyunkwan Univ, Dept Chem, SKKU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea
[3]
Exceptional ballistic transport in epitaxial graphene nanoribbons
[J].
Baringhaus, Jens
;
Ruan, Ming
;
Edler, Frederik
;
Tejeda, Antonio
;
Sicot, Muriel
;
Taleb-Ibrahimi, Amina
;
Li, An-Ping
;
Jiang, Zhigang
;
Conrad, Edward H.
;
Berger, Claire
;
Tegenkamp, Christoph
;
de Heer, Walt A.
.
NATURE,
2014, 506 (7488)
:349-354

Baringhaus, Jens
论文数: 0 引用数: 0
h-index: 0
机构:
Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany

Ruan, Ming
论文数: 0 引用数: 0
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机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany

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Tejeda, Antonio
论文数: 0 引用数: 0
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机构:
Univ Lorraine, UMR CNRS 7198, Inst Jean Lamour, F-54506 Vandoeuvre Les Nancy, France
UR1 CNRS Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany

Sicot, Muriel
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Lorraine, UMR CNRS 7198, Inst Jean Lamour, F-54506 Vandoeuvre Les Nancy, France Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany

Taleb-Ibrahimi, Amina
论文数: 0 引用数: 0
h-index: 0
机构:
UR1 CNRS Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany

Li, An-Ping
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany

Jiang, Zhigang
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany

Conrad, Edward H.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany

Berger, Claire
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
CNRS UJF INP, Inst Neel, F-38042 Grenoble 6, France Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany

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de Heer, Walt A.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA Leibniz Univ Hannover, Inst Festkorperphys, D-30167 Hannover, Germany
[4]
Effect of a single localized impurity on the local density of states in monolayer and bilayer graphene
[J].
Bena, Cristina
.
PHYSICAL REVIEW LETTERS,
2008, 100 (07)

Bena, Cristina
论文数: 0 引用数: 0
h-index: 0
机构:
CEA Saclay, Serv Phys Theor, F-91190 Gif Sur Yvette, France CEA Saclay, Serv Phys Theor, F-91190 Gif Sur Yvette, France
[5]
Spectral footprints of impurity scattering in graphene nanoribbons
[J].
Bergvall, Anders
;
Lofwander, Tomas
.
PHYSICAL REVIEW B,
2013, 87 (20)

Bergvall, Anders
论文数: 0 引用数: 0
h-index: 0
机构:
Chalmers, Dept Microtechnol & Nanosci MC2, SE-41296 Gothenburg, Sweden Chalmers, Dept Microtechnol & Nanosci MC2, SE-41296 Gothenburg, Sweden

Lofwander, Tomas
论文数: 0 引用数: 0
h-index: 0
机构:
Chalmers, Dept Microtechnol & Nanosci MC2, SE-41296 Gothenburg, Sweden Chalmers, Dept Microtechnol & Nanosci MC2, SE-41296 Gothenburg, Sweden
[6]
Quasiparticle Chirality in Epitaxial Graphene Probed at the Nanometer Scale
[J].
Brihuega, I.
;
Mallet, P.
;
Bena, C.
;
Bose, S.
;
Michaelis, C.
;
Vitali, L.
;
Varchon, F.
;
Magaud, L.
;
Kern, K.
;
Veuillen, J. Y.
.
PHYSICAL REVIEW LETTERS,
2008, 101 (20)

Brihuega, I.
论文数: 0 引用数: 0
h-index: 0
机构:
Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

Mallet, P.
论文数: 0 引用数: 0
h-index: 0
机构:
UJF, CNR, Inst Neel, F-38042 Grenoble, France Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

Bena, C.
论文数: 0 引用数: 0
h-index: 0
机构:
CEA Saclay, Inst Phys Theor, F-91190 Gif Sur Yvette, France Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

Bose, S.
论文数: 0 引用数: 0
h-index: 0
机构:
Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

Michaelis, C.
论文数: 0 引用数: 0
h-index: 0
机构:
Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

Vitali, L.
论文数: 0 引用数: 0
h-index: 0
机构:
Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

Varchon, F.
论文数: 0 引用数: 0
h-index: 0
机构:
UJF, CNR, Inst Neel, F-38042 Grenoble, France Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

Magaud, L.
论文数: 0 引用数: 0
h-index: 0
机构: Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

Kern, K.
论文数: 0 引用数: 0
h-index: 0
机构:
Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
Ecole Polytech Fed Lausanne, Inst Phys Nanostruct, CH-1015 Lausanne, Switzerland Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

Veuillen, J. Y.
论文数: 0 引用数: 0
h-index: 0
机构:
UJF, CNR, Inst Neel, F-38042 Grenoble, France Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
[7]
Atomically precise bottom-up fabrication of graphene nanoribbons
[J].
Cai, Jinming
;
Ruffieux, Pascal
;
Jaafar, Rached
;
Bieri, Marco
;
Braun, Thomas
;
Blankenburg, Stephan
;
Muoth, Matthias
;
Seitsonen, Ari P.
;
Saleh, Moussa
;
Feng, Xinliang
;
Muellen, Klaus
;
Fasel, Roman
.
NATURE,
2010, 466 (7305)
:470-473

Cai, Jinming
论文数: 0 引用数: 0
h-index: 0
机构:
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-8600 Dubendorf, Switzerland Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

Ruffieux, Pascal
论文数: 0 引用数: 0
h-index: 0
机构:
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-8600 Dubendorf, Switzerland Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

Jaafar, Rached
论文数: 0 引用数: 0
h-index: 0
机构:
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-8600 Dubendorf, Switzerland Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

Bieri, Marco
论文数: 0 引用数: 0
h-index: 0
机构:
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-8600 Dubendorf, Switzerland Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

Braun, Thomas
论文数: 0 引用数: 0
h-index: 0
机构:
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-8600 Dubendorf, Switzerland Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

Blankenburg, Stephan
论文数: 0 引用数: 0
h-index: 0
机构:
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland
Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-8600 Dubendorf, Switzerland Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

Muoth, Matthias
论文数: 0 引用数: 0
h-index: 0
机构:
ETH, Dept Mech & Proc Engn Micro & Nanosyst, CH-8092 Zurich, Switzerland Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

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Saleh, Moussa
论文数: 0 引用数: 0
h-index: 0
机构:
Max Planck Inst Polymer Res, D-55124 Mainz, Germany Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

Feng, Xinliang
论文数: 0 引用数: 0
h-index: 0
机构:
Max Planck Inst Polymer Res, D-55124 Mainz, Germany Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

Muellen, Klaus
论文数: 0 引用数: 0
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机构:
Max Planck Inst Polymer Res, D-55124 Mainz, Germany Empa, Swiss Fed Labs Mat Sci & Technol, Nanotech Surfaces Lab, CH-3602 Thun, Switzerland

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[8]
The electronic properties of graphene
[J].
Castro Neto, A. H.
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Guinea, F.
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Peres, N. M. R.
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Novoselov, K. S.
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Geim, A. K.
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REVIEWS OF MODERN PHYSICS,
2009, 81 (01)
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Castro Neto, A. H.
论文数: 0 引用数: 0
h-index: 0
机构:
Boston Univ, Dept Phys, Boston, MA 02215 USA Boston Univ, Dept Phys, Boston, MA 02215 USA

Guinea, F.
论文数: 0 引用数: 0
h-index: 0
机构:
CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain Boston Univ, Dept Phys, Boston, MA 02215 USA

Peres, N. M. R.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Minho, Ctr Phys, P-4710057 Braga, Portugal Boston Univ, Dept Phys, Boston, MA 02215 USA

Novoselov, K. S.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Dept Phys & Astron, Manchester M13 9PL, Lancs, England Boston Univ, Dept Phys, Boston, MA 02215 USA

Geim, A. K.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Dept Phys & Astron, Manchester M13 9PL, Lancs, England Boston Univ, Dept Phys, Boston, MA 02215 USA
[9]
Grain boundary loops in graphene
[J].
Cockayne, Eric
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Rutter, Gregory M.
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Guisinger, Nathan P.
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Crain, Jason N.
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First, Phillip N.
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Stroscio, Joseph A.
.
PHYSICAL REVIEW B,
2011, 83 (19)

Cockayne, Eric
论文数: 0 引用数: 0
h-index: 0
机构:
NIST, Div Ceram, Gaithersburg, MD 20899 USA NIST, Div Ceram, Gaithersburg, MD 20899 USA

Rutter, Gregory M.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA
NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA NIST, Div Ceram, Gaithersburg, MD 20899 USA

Guisinger, Nathan P.
论文数: 0 引用数: 0
h-index: 0
机构:
NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA NIST, Div Ceram, Gaithersburg, MD 20899 USA

Crain, Jason N.
论文数: 0 引用数: 0
h-index: 0
机构:
NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA NIST, Div Ceram, Gaithersburg, MD 20899 USA

First, Phillip N.
论文数: 0 引用数: 0
h-index: 0
机构:
Georgia Inst Technol, Sch Phys, Atlanta, GA 30332 USA NIST, Div Ceram, Gaithersburg, MD 20899 USA

Stroscio, Joseph A.
论文数: 0 引用数: 0
h-index: 0
机构:
NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA NIST, Div Ceram, Gaithersburg, MD 20899 USA
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