An Improved Electric Field Probe with Applications in High Efficiency PA Design and Diagnostics

被引：0

作者：

Dehghan, N. ^{[1
]}

Cripps, S. ^{[1
]}

Reh, A. Po ^{[1
]}

Lees, J. ^{[1
]}

机构：

[1] Cardiff Univ, Cardiff CF10 3AX, S Glam, Wales

来源：

2013 81ST ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG) | 2013年

关键词：

High power amplifiers; microwave measurements; microwave imaging; microwave transistors;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An Electric Field Probe is described, which has substantially improved bandwidth and spatial resolution compared to previously reported work [1]. Calibration tests on the reported probe shows a flat amplitude and phase response up to 6GHz. A novel calibration technique is described, which has enabled direct observation of device plane voltages in high power RFPAs. Results show evidence of various anomalous effects, including variation of voltage across the periphery of high power RF devices.

引用

页数：4