X-ray polarimetry by means of Compton scattering in the sensor of a hybrid photon counting pixel detector

被引：11

作者：

Michel, T. ^{[1
]}

Durst, J. ^{[1
]}

Jakubek, J. ^{[2
]}

机构：

[1] Univ Erlangen Nurnberg, ECAP, D-91058 Erlangen, Germany

[2] Czech Tech Univ, Inst Expt & Appl Phys, CZ-12800 Prague 2, Czech Republic

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2009年 / 603卷 / 03期

关键词：

X-ray; Polarization; Polarimetry; Photon counting pixel detector; ASTRONOMY; MEDIPIX2; CRAB;

D O I：

10.1016/j.nima.2009.02.032

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

For the first time a hybrid semiconductor photon counting pixel detector has been used for measurements of linear X-ray polarization by exploiting the Compton effect in the silicon sensor layer. The time-to-shutter mode of the X-ray imaging detector Timepix was used to identify Compton-scattering events in the sensor layer by the analysis of coincidences. For irradiation with polarized X-ray photons of energies between 27 and 84 keV we were able to measure a large modulation factor of mu(meas) = (68.1 +/- 16.4)% for this type of X-ray polarimeter. Degree and orientation of linear polarization can be determined. This publication describes the experimental setup, data analysis method, measurement and simulation results, and gives first estimations on the polarimetric performance for an application in X-ray astronomy. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：384 / 392

页数：9

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