Influence of doping concentration on Ni-induced lateral crystallization of amorphous silicon films

被引:4
作者
Minagawa, Y
Yazawa, Y
Muramatsu, S
机构
[1] Hitachi Cable Ltd, Adv Res Ctr, Tsuchiura, Ibaraki 3000026, Japan
[2] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan
关键词
MILC; Ni; Si film; crystallization;
D O I
10.1016/S0927-0248(02)00086-7
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Nickel-metal-induced lateral crystallization (MILC) was used to fabricate polycrystalline silicon thin films on glass substrates. Patterned Ni lines were formed on amorphous Si films by a lift-off process using photo resist. The samples were annealed in an N-2 atmosphere in a furnace at temperatures ranging from 550degreesC to 600degreesC. Both the doping concentration of the Si films and the annealing temperature strongly affected the orientation of the crystals. A p-type poly-Si film with a boron concentration of 5x10(19) cm(-3) annealed at 550 C was found to be strongly oriented in the <220> direction. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:283 / 287
页数:5
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