K shell fluorescence yield of Cd and Zn in Cd1-xZnxS thin films

被引：8

作者：

Bacaksiz, E. ^{[1
]}

Cevik, U. ^{[1
]}

机构：

[1] Karadeniz Tech Univ, Fac Arts & Sci, Dept Phys, TR-61080 Trabzon, Turkey

来源：

CHEMICAL PHYSICS LETTERS | 2006年 / 427卷 / 1-3期

关键词：

D O I：

10.1016/j.cplett.2006.05.117

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The K shell fluorescence yield omega(K) of Cd and Zn in Cd1-xZnxS semiconductors has been studied. Energy dispersive X-ray fluorescence (EDXRF) technique was used to measure K X-ray photons. Cd and Zn elements were excited by using 59.5 keV photons emitted by a 50 mCi(241) Am radioactive source. The emitted characteristic K X-rays were detected by a Si (Li) detector having a resolution of 160 eV at 5.9 keV. It was found that the K shell fluorescence yield COK changed in Cd1-xZnxS thin films for different compositions of x. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：132 / 136

页数：5

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