Environmental Stress Testing of Electro-Optic Polymer Modulators

被引：40

作者：

Dinu, Raluca ^{[1
]}

Jin, Dan ^{[1
]}

Yu, Guomin ^{[1
]}

Chen, Baoquan ^{[1
]}

Huang, Diyun ^{[1
]}

Chen, Hui ^{[1
]}

Barklund, Anna ^{[1
]}

Miller, Eric ^{[1
]}

Wei, Cailin ^{[1
]}

Vemagiri, Jeevan ^{[1
]}

机构：

[1] Lumera Corp, Bothell, WA 98011 USA

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 2009年 / 27卷 / 11期

关键词：

Electro-optic (EO) polymer; environmental testing; modulator; optical waveguide; photostability; WAVE-GUIDE; NONLINEARITY; HOST;

D O I：

10.1109/JLT.2009.2014178

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Low V-pi electro-optic (EO) polymer modulators were environmental stress tested at both the chip and packaged device level. Different top clad materials showed different results for high-temperature and temperature cycle testing, which is related mostly to coefficient of thermal expansion (CTE) mismatches and/or adhesion properties of the clads related to other materials in the devices stack and to the substrate and electrode materials. With thoroughly compatible cladding, devices that are thermally stable for over 5000 h at 85 C have been achieved. High optical power (500 mW @ 1550 nm) tests showed the photochemical stability of the EO polymer material in hermetically sealed packages. The results demonstrate that clad polymers and interactions between devices layers are of concern for achieving environmentally stable EO polymers modulators.

引用

页码：1527 / 1532

页数：6

共 23 条

[1] Polymer wavelength channel selector composed of electrooptic polymer switch array and two polymer arrayed waveguide gratings [J].