Diagnostics of nanoparticle formation process by laser ablation in a background gas

被引:0
|
作者
Okada, T [1 ]
Nakata, Y [1 ]
Maeda, M [1 ]
机构
[1] Kyushu Univ, Fac Informat Sci & Elect Engn, Fukuoka 8128581, Japan
来源
PHOTON PROCESSING IN MICROELECTRONICS AND PHOTONICS | 2002年 / 4637卷
关键词
nano-particles; laser ablation; imaging; decomposition; laser-induced fluorescence; Rayleigh scattering;
D O I
10.1117/12.470633
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have developed a new visualization technique named as re-decomposition laser-induced fluorescence (ReD-LIF), in order to investigate the dynamics of clusters, which are difficult to be visualized by any other means. In the ReD-LIF technique, clusters or nano-particles synthesized in the laser ablation plume are decomposed by laser irradiation and the atoms generated by the decomposition are visualized by LIF. This technique is very sensitive than the other visualization technique, be-cause we can use the sensitive LIF technique. Decomposition of nano-particles by the laser irradiation is considered theoretically and the characteristics, of ReD-LIF technique are compared with other visualization techniques such as laser-induced fluorescence (LIF) and Rayleigh scattering. The ReD-LIF technique has been applied for the visualization of the Si nano-particle synthesis process. Based on the results, the particle dynamics in the ablation plume generated in the background gas during Si nano-particle synthesis are described besides the basic characteristics of the ReD-LIF signal.
引用
收藏
页码:21 / 30
页数:10
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