With the rapid development of HVDC technology, the detection and analysis of partial discharge (PD) under HVDC are new challenges to ensure reliable operation of the related power apparatus. The wavelet technique has been proposed for analyzing PD pulses under HV AC and ultra- high frequency signal, but its application for PD under HVDC has not been discussed. This paper dealt with the selection of the optimal wavelet and thresholding for PD pulses in order to apply the wavelet technique to PD detection under HVDe. Four electrode systems, namely protrusion on conductor, protrusion on enclosure, free particle, and crack inside spacer were fabricated to simulate typical defects in a gas insulated switchgear. The detected PD pulses were decomposed by multiresolution analysis. The correlation coefficient and dynamic time warping methods were used to select the optimal wavelet. The optimal threshold and thresholding function were chosen from various combinations with the simulated pulses. The results revealed that processing PD pulses with the mother wavelet of bior2.6, automatic threshold, and intermediate thresholding function presented the best performance.
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Univ Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
CEPEL ELETROBRAS, Elect Energy Res Ctr, Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
Cunha, Caio F. F. C.
Carvalho, Andre T.
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Univ Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
CEPEL ELETROBRAS, Elect Energy Res Ctr, Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
Carvalho, Andre T.
Petraglia, Mariane R.
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Univ Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
Petraglia, Mariane R.
Lima, Antonio C. S.
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Univ Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
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Chongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R ChinaChongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R China
Li, Jian
Jiang, Tianyan
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Chongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R ChinaChongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R China
Jiang, Tianyan
Grzybowski, Stanislaw
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Mississippi State Univ, Dept Elect & Comp Engn, High Voltage Lab, Mississippi State, MS 39762 USAChongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R China
Grzybowski, Stanislaw
Cheng, Changkui
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Chongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R ChinaChongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R China
机构:
Univ Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
CEPEL ELETROBRAS, Elect Energy Res Ctr, Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
Cunha, Caio F. F. C.
Carvalho, Andre T.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
CEPEL ELETROBRAS, Elect Energy Res Ctr, Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
Carvalho, Andre T.
Petraglia, Mariane R.
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h-index: 0
机构:
Univ Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
Petraglia, Mariane R.
Lima, Antonio C. S.
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h-index: 0
机构:
Univ Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, RJ, Brazil
机构:
Chongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R ChinaChongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R China
Li, Jian
Jiang, Tianyan
论文数: 0引用数: 0
h-index: 0
机构:
Chongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R ChinaChongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R China
Jiang, Tianyan
Grzybowski, Stanislaw
论文数: 0引用数: 0
h-index: 0
机构:
Mississippi State Univ, Dept Elect & Comp Engn, High Voltage Lab, Mississippi State, MS 39762 USAChongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R China
Grzybowski, Stanislaw
Cheng, Changkui
论文数: 0引用数: 0
h-index: 0
机构:
Chongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R ChinaChongqing Univ, State Key Lab Power Equipment & Syst Secur & New, Dept High Voltage & Insulat Engn, Coll Elect Engn, Chongqing 400044, Peoples R China