共 48 条
[1]
Thermal metrology of silicon microstructures using Raman spectroscopy
[J].
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES,
2007, 30 (02)
:200-208
[3]
Beckers H., 1956, APPL SCI RES A, V6, P82
[8]
CHUI BW, 1999, MICROSCALE THERM ENG, V3