Analysis and design of Si terahertz transit-time diodes

被引:3
作者
Bi, Xiaochuan
East, Jack R.
Ravaioli, Umberto
Haddad, George I.
机构
[1] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA
[2] Univ Illinois, Beckman Inst, Urbana, IL 61801 USA
[3] Univ Illinois, ECE Dept, Urbana, IL 61801 USA
关键词
transit-time diode; full band Monte Carlo simulation; terahertz frequency;
D O I
10.1016/j.sse.2006.04.007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a numerical simulation of a Si MITATT diode working in the submillimeter-wave and lower terahertz frequency range. A full band Monte Carlo simulation that included the microscopic details of carrier transport and a simpler drift-diffusion based model were used to investigate the diode DC, small-signal and large-signal properties of MITATT diodes operating between 200 and 300 GHz. Although the full band Monte Carlo simulation shows the effects of transient velocities and dead zones required by energy conservation during ionization, there is still a reasonable agreement between the two simulations. The results show that silicon based transit-time devices can produce significant power up to high submillimeter-wave frequencies. The paper will describe the simulation of transit-time devices at very high frequencies, compare results from a detailed physical Monte Carlo model with a numerically simpler drift-diffusion approach and describe device performance between 200 and 300 GHz. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:889 / 896
页数:8
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