RazorII: In Situ Error Detection and Correction for PVT and SER Tolerance

被引:399
作者
Das, Shidhartha [1 ]
Tokunaga, Carlos [2 ]
Pant, Sanjay [4 ]
Ma, Wei-Hsiang [2 ]
Kalaiselvan, Sudherssen [5 ]
Lai, Kevin [3 ]
Bull, David M. [1 ]
Blaauw, David T. [2 ]
机构
[1] ARM Ltd, Cambridge CB1 9NJ, England
[2] Univ Michigan, Dept Comp Sci & Elect Engn, Adv Comp Architecture Lab, Ann Arbor, MI 48109 USA
[3] Intel Corp, Hillsboro, OR 97124 USA
[4] Adv Micro Devices Inc, Ft Collins, CO 80528 USA
[5] Adv Micro Devices Inc, Sunnyvale, CA 94085 USA
关键词
Adaptive circuits; dynamic voltage and frequency scaling (DVFS); process variations; self-tuning processor; single event upsets; DYNAMIC VOLTAGE; SUPPLY-VOLTAGE;
D O I
10.1109/JSSC.2008.2007145
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Traditional adaptive methods that compensate for PVT variations need safety margins and cannot respond to rapid environmental changes. In this paper, we present a design (RazorII) which implements a flip-flop with in situ detection and architectural correction of variation-induced delay errors. Error detection is based on flagging spurious transitions in the state-holding latch node. The RazorII flip-flop naturally detects logic and register SER. We implement a 64-bit processor in 0.13 mu m technology which uses RazorII for SER tolerance and dynamic supply adaptation. RazorII based DVS allows elimination of safety margins and operation at the point of first failure of the processor. We tested and measured 32 different dies and obtained 33% energy savings over traditional DVS using RazorII for supply voltage control. We demonstrate SER tolerance on the RazorII processor through radiation experiments.
引用
收藏
页码:32 / 48
页数:17
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