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- [32] Development of a high-speed profilometer for manufacturing inspection INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING IV, 2010, 7767
- [40] A Row Displacement Correction Algorithm for High-speed and Accurate Terahertz Raster Scanning Imaging Journal of Infrared, Millimeter, and Terahertz Waves, 2023, 44 : 1038 - 1051