Specular and off-specular x-ray reflectivity study of ion irradiated Co/Pt multilayers

被引:2
作者
Schug, C
Grimm, H
Berger, R
Dietzel, A
Wormington, M
机构
[1] IBM Deutschland Speichersyst GmbH, D-55131 Mainz, Germany
[2] Bede Sci Inc, Englewood, CO USA
关键词
Co/Pt multilayers; diffuse x-ray scatter; x-ray reflectivity; DWBA;
D O I
10.1002/sia.1797
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Co/Pt thin film superlattices with strong perpendicular anisotropy and out-of-plane coercivities of 5-11 kOe were irradiated with Xe+ ions to tailor their magnetic properties. Specular and off-specular x-ray reflectivity (XRR) studies were performed to correlate the irradiation-induced coercivity reduction with changes of the interfacial properties. Off-specular XRR turned out to be particularly sensitive to the Co/Pt superlattice period. By applying the distorted wave Born approximation to simulate the diffusely scattered intensity, we were able to quantify the vertical roughness correlation throughout the superlattice stack. Study of a Co/Pt multilayer exposed to different Xe+ ion doses suggests that progressive ion bombardment causes a gradual loss of conformality between the different interfaces and a change of the interface morphology, whereas initial vertical RMS roughness values are not affected. Copyright (C) 2004 John Wiley Sons, Ltd.
引用
收藏
页码:908 / 911
页数:4
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