Bent Polytypic ZnSe and CdSe Nanowires Probed by Photoluminescence

被引:7
作者
Kim, Yejin [1 ]
Im, Hyung Soon [1 ]
Park, Kidong [1 ]
Kim, Jundong [1 ]
Ahn, Jae-Pyoung [2 ]
Yoo, Seung Jo [3 ]
Kim, Jin-Gyu [3 ]
Park, Jeunghee [1 ]
机构
[1] Korea Univ, Dept Chem, Jochiwon 339700, South Korea
[2] Korea Inst Sci & Technol, Adv Anal Ctr, Seoul 136791, South Korea
[3] Korea Basic Sci Inst, Div Electron Microscop Res, Daejeon 305806, South Korea
关键词
SEMICONDUCTOR NANOWIRES; OPTICAL-PROPERTIES; LIGHT-EMISSION; ELECTRICAL-PROPERTIES; MOBILITY ENHANCEMENT; GERMANIUM NANOWIRES; ELASTIC PROPERTIES; STRAIN-GRADIENT; STACKING-FAULTS; YOUNGS MODULUS;
D O I
10.1002/smll.201603695
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Nanowires (NWs) have witnessed tremendous development over the past two decades owing to their varying potential applications. Semiconductor NWs often contain stacking faults due to the presence of coexisting phases, which frequently hampers their use. Herein, it is investigated how stacking faults affect the optical properties of bent ZnSe and CdSe NWs, which are synthesized using the vapor transport method. Polytypic zinc blende-wurtzite structures are produced for both these NWs by altering the growth conditions. The NWs are bent by the mechanical buckling of poly(dimethylsilioxane), and micro-photoluminescence (PL) spectra were then collected for individual NWs with various bending strains (0-2%). The PL measurements show peak broadening and red shifts of the near-band-edge emission as the bending strain increases, indicating that the bandgap decreases with increasing the bending strain. Remarkably, the bandgap decrease is more significant for the polytypic NWs than for the single phase NWs. This work provides insights into flexible electronic devices of 1D nanostructures by engineering the polytypic structures.
引用
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页数:9
相关论文
共 48 条
[1]  
Adachi S, 2004, Handbook on Physical Properties of Semiconductors: Volume 3: II-VI Compound Semiconductors, V3
[2]  
Broser I., 1999, LANDOLT BORNSTEIN 3, V17
[3]   Correlation of Electrical and Structural Properties of Single As-Grown GaAs Nanowires on Si (111) Substrates [J].
Bussone, Genziana ;
Schaefer-Eberwein, Heiko ;
Dimakis, Emmanouil ;
Biermanns, Andreas ;
Carbone, Dina ;
Tahraoui, Abbes ;
Geelhaar, Lutz ;
Bolivar, Peter Haring ;
Schuelli, Tobias U. ;
Pietsch, Ullrich .
NANO LETTERS, 2015, 15 (02) :981-989
[4]   Strengthening Brittle Semiconductor Nanowires through Stacking Faults: Insights from in Situ Mechanical Testing [J].
Chen, Bin ;
Wang, Jun ;
Gao, Qiang ;
Chen, Yujie ;
Liao, Xiaozhou ;
Lu, Chunsheng ;
Tan, Hark Hoe ;
Mai, Yiu-Wing ;
Zou, Jin ;
Ringer, Simon P. ;
Gao, Huajian ;
Jagadish, Chennupati .
NANO LETTERS, 2013, 13 (09) :4369-4373
[5]   Anelastic Behavior in GaAs Semiconductor Nanowires [J].
Chen, Bin ;
Gao, Qiang ;
Wang, Yanbo ;
Liao, Xiaozhou ;
Mai, Yiu-Wing ;
Tan, Hark Hoe ;
Zou, Jin ;
Ringer, Simon P. ;
Jagadish, Chennupati .
NANO LETTERS, 2013, 13 (07) :3169-3172
[6]   A study of the size-dependent elastic properties of CdSe nanowires [J].
Chen, Na ;
Xie, Yiqun ;
Liu, Feng ;
Ye, Xiang ;
Shi, WangZhou .
COMPUTATIONAL MATERIALS SCIENCE, 2013, 77 :245-249
[7]   Effect of a High Density of Stacking Faults on the Young's Modulus of GaAs Nanowires [J].
Chen, Yujie ;
Burgess, Tim ;
An, Xianghai ;
Mai, Yiu-Wing ;
Tan, H. Hoe ;
Zou, Jin ;
Ringer, Simon P. ;
Jagadish, Chennupati ;
Liao, Xiaozhou .
NANO LETTERS, 2016, 16 (03) :1911-1916
[8]   Mechanical Properties of Silicon Carbide Nanowires: Effect of Size-Dependent Defect Density [J].
Cheng, Guangming ;
Chang, Tzu-Hsuan ;
Qin, Qingquan ;
Huang, Hanchen ;
Zhu, Yong .
NANO LETTERS, 2014, 14 (02) :754-758
[9]   Elastic Properties of GaN Nanowires: Revealing the Influence of Planar Defects on Young's Modulus at Nanoscale [J].
Dai, Sheng ;
Zhao, Jiong ;
He, Mo-rigen ;
Wang, Xiaoguang ;
Wan, Jingchun ;
Shan, Zhiwei ;
Zhu, Jing .
NANO LETTERS, 2015, 15 (01) :8-15
[10]   25th Anniversary Article: Semiconductor Nanowires Synthesis, Characterization, and Applications [J].
Dasgupta, Neil P. ;
Sun, Jianwei ;
Liu, Chong ;
Brittman, Sarah ;
Andrews, Sean C. ;
Lim, Jongwoo ;
Gao, Hanwei ;
Yan, Ruoxue ;
Yang, Peidong .
ADVANCED MATERIALS, 2014, 26 (14) :2137-2184