Vapor sorption in thin supported polymer films studied by white light interferometry

被引:36
作者
Manoli, Kyriaki
Goustouridis, Dimitris
Chatzandroulis, Stavros
Raptis, Ioannis
Valamontes, Evangelos S.
Sanopoulou, Merope [1 ]
机构
[1] NCSR Demokritos, Inst Phys Chem, GR-15310 Athens, Greece
[2] NCSR Demokritos, Inst Microelect, GR-15310 Athens, Greece
[3] Technol Educ Inst Athens, Dept Elect, Aegaleo 12210, Greece
关键词
vapor sorption; poly(2-hydroxyethyl methacrylate); poly(methyl methacrylate);
D O I
10.1016/j.polymer.2006.06.016
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
In the present study, we apply a white light interferometric methodology to study sorption of moisture and methanol vapor in thin films of poly(2-hydroxyethyl methacrylate) [PHEMA] and poly(methyl methacrylate) [PMMA], supported on oxidized silicon wafers. The measured equilibrium thickness expansion of each film, exposed to different activities of the vapor penetrant, is used to determine the sorption isotherm of the system. Results for relatively thick films (100 nm < L-o < 600 nm) are compared with corresponding literature data for bulk, free-standing films, obtained by direct gravimetric methods. Furthermore, PMMA films of thicknesses lower than 100 nm were employed in order to study the effect of the dry film's thickness, and of substrate, on fractional swelling. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:6117 / 6122
页数:6
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