共 52 条
[1]
[Anonymous], 1997, DIGITAL CIRCUIT TEST
[2]
[Anonymous], 1992, SMR
[5]
Bahr D., 1982, Electronics Test, V5
[6]
Bradley D, 2000, SECOND NASA/DOD WORKSHOP ON EVOLVABLE HARDWARE, PROCEEDINGS, P215
[7]
Bradley DW, 2000, IEEE SYS MAN CYBERN, P107, DOI 10.1109/ICSMC.2000.884973
[8]
Bradley DW, 2000, LECT NOTES COMPUT SC, V1801, P11
[9]
Breuer M.A., 1976, Diagnosis and Reliable Design of Digital Systems
[10]
How an ''evolving'' fault model improves the behavioral test generation
[J].
SEVENTH GREAT LAKES SYMPOSIUM ON VLSI, PROCEEDINGS,
1997,
:124-129