Self-reconstruction and Rectification of Non-diffracting Beams after Focusing

被引：0
作者：
Liu, Lan [1 ]
Zhang, Haitao [1 ]
Wu, Pengtie [2 ]
机构：
[1] Luohe Med Coll, Luohe 462002, Peoples R China
[2] Huaqiao Univ, Quanzhou 362021, Peoples R China
来源：
PIERS 2014 GUANGZHOU: PROGRESS IN ELECTROMAGNETICS RESEARCH SYMPOSIUM | 2014年
基金：
中国国家自然科学基金;
关键词：
BESSEL BEAM;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Based on Huygens-Fresnel diffraction integral, the expression of intensity distribution of the self-reconstruction beam is obtained and used to study the intensity evolution of self-reconstruction beams. It is shown that the intense central spot size of the self-reconstruction beam is larger than that of the non-diffracting beam before focusing. This property limits the application of the self-reconstruction beams.
引用
收藏
页码：1057 / 1060
页数：4
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