共 9 条
[2]
STRUCTURAL DETERMINATION OF CRYSTALLINE SILICON BY EXTENDED ENERGY-LOSS FINE-STRUCTURE SPECTROSCOPY
[J].
PHYSICAL REVIEW B,
1989, 39 (12)
:8409-8422
[3]
FOXRABINOVICH GS, 1998, ELECT SPECTROSC RELA, V85, P65
[5]
KOVALEV AI, 1990, VACUUM, V41, P1794
[7]
SHERWOOD PMA, 1987, PRACTICAL SURFACE AN, P497
[8]
WAINSTEIN DL, 2000, THESIS, P40