Analysis of strain-induced polarisation-insensitive integrated waveguides fabricated using ion-implantation-induced intermixing

被引:10
作者
Djie, HS [1 ]
Ng, SL
Gunawan, O
Dowd, P
Aimez, V
Beauvais, J
Beerens, J
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Photon Res Grp, Singapore 639798, Singapore
[2] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
[3] Univ Sherbrooke, Ctr Rech Proprietes Elect Mat Avances, Dept Genie Elect & Genie Informat, Sherbrooke, PQ J1K 2R1, Canada
来源
IEE PROCEEDINGS-OPTOELECTRONICS | 2002年 / 149卷 / 04期
关键词
D O I
10.1049/ip-opt:20020528
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The interdiffusion effect on the strain build-up and refractive index profile of lattice-matched InGaAs/InGaAsP multiple quantum wells is reported. Interdiffusion is achieved experimentally using low energy (360 keV) arsenic or phosphorus ion-implantation-induced disordering, followed by an annealing step. A model of the interdiffusion process has been developed to analyse the effect of different interdiffusion ratios on the waveguide's polarisation behaviour through the strain build-up and the refractive index profiles for the transverse electric and transverse magnetic modes. Polarisation-resolved photocurrent absorption measurements of quantum-well waveguide structures have shown that sufficiently high ion implantation doses can lead to the realisation of polarisation-insensitive waveguides at 1.55 mum wavelength operation. Comparison with the modelling results shows that the polarisation-dependent behaviour of the waveguides is best described by a higher interdiffusion ratio for the group V than for the group III atoms.
引用
收藏
页码:138 / 144
页数:7
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