VACUUM WAFER LEVEL PACKAGED TWO-DIMENSIONAL OPTICAL SCANNER BY ANODIC BONDING

被引:17
作者
Tachibana, H.
Kawano, K.
Ueda, H.
Noge, H.
机构
来源
IEEE 22ND INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS (MEMS 2009) | 2009年
关键词
MEMS;
D O I
10.1109/MEMSYS.2009.4805544
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Vacuum wafer-level packaged two-dimensional optical scanners actuated by vertical electrostatic combs have been developed. A 1 mm-diameter gimbal mirror with high frequency deflection and a surrounding 2.5 x 3 mm movable frame with low frequency deflection are fabricated in a SOI wafer. Wafer-level packaging with anodically bonded borosilicate glass substrates on both sides together with non- evaporable getters fixed on the lower glass substrate allows hermetic sealing in high vacuum. The gimbal mirror and the movable frame are both deflected mechanically +/- 12 deg. at a resonant frequency of 25.1 kHz with a driving voltage of 18 V, and at a resonant frequency of 78.6 Hz with a driving voltage of 10 V, respectively. The internal pressure of the device is 20 Pa.
引用
收藏
页码:959 / 962
页数:4
相关论文
共 8 条
[1]   MEMS-Based Pico Projector Display [J].
Davis, Wyatt O. ;
Sprague, Randy ;
Miller, Josh .
2008 IEEE/LEOS INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICS, 2008, :31-32
[2]   VACUUM PACKAGING FOR MICROSENSORS BY GLASS SILICON ANODIC BONDING [J].
HENMI, H ;
SHOJI, S ;
SHOJI, Y ;
YOSHIMI, K ;
ESASHI, M .
SENSORS AND ACTUATORS A-PHYSICAL, 1994, 43 (1-3) :243-248
[3]  
Hsu S., 2008, P SOC PHOTO-OPT INS, V6887
[4]   Stable and reliable Q-factor in resonant MEMS with getter film [J].
Longoni, G. ;
Conte, A. ;
Moraja, M. ;
Fourrier, A. .
2006 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 44TH ANNUAL, 2006, :416-+
[5]   MEMS optical scanners for microscopes [J].
Miyajima, H ;
Murakami, K ;
Katashiro, M .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2004, 10 (03) :514-527
[6]   Electrostatically Actuated Two-Dimensional Optical Scanner Having a High Resonant Frequency Ratio of Fast/Slow Axes [J].
Noge, Hiroshi ;
Hagihara, Yosuke ;
Kawano, Kiyohiko ;
Ueda, Hideki ;
Yoshihara, Takaaki .
IEICE TRANSACTIONS ON ELECTRONICS, 2008, E91C (10) :1611-1615
[7]   Large deflection micromechanical scanning mirrors for linear scans and pattern generation [J].
Schenk, H ;
Dürr, P ;
Haase, T ;
Kunze, D ;
Sobe, U ;
Lakner, H ;
Kück, H .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2000, 6 (05) :715-722
[8]   FIELD ASSISTED GLASS-METAL SEALING [J].
WALLIS, G ;
POMERANT.DI .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (10) :3946-&