Broadband Rydberg Atom-Based Electric-Field Probe for SI-Traceable, Self-Calibrated Measurements

被引:321
作者
Holloway, Christopher L. [1 ]
Gordon, Joshua A. [1 ]
Jefferts, Steven [1 ]
Schwarzkopf, Andrew [2 ]
Anderson, David A. [2 ]
Miller, Stephanie A. [2 ]
Thaicharoen, Nithiwadee [2 ]
Raithel, Georg [2 ]
机构
[1] NIST, US Dept Commerce, Boulder Labs, Boulder, CO 80305 USA
[2] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA
关键词
Atom based metrology; Autler-Townes splitting; broadband sensor and probe; electrical field measurements and sensor; electromagnetically induced transparency (EIT); Rydberg atoms; sub-wavelength imaging; ELECTROMAGNETICALLY-INDUCED-TRANSPARENCY;
D O I
10.1109/TAP.2014.2360208
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We discuss a fundamentally new approach for the measurement of electric (E) fields that will lead to the development of a broadband, direct SI-traceable, compact, self-calibrating E-field probe (sensor). This approach is based on the interaction of radio frequency (RF) fields with alkali atoms excited to Rydberg states. The RF field causes an energy splitting of the Rydberg states via the Autler-Townes effect and we detect the splitting via electromagnetically induced transparency. In effect, alkali atoms placed in a vapor cell act like an RF-to-optical transducer, converting an RF E-field strength measurement to an optical frequency measurement. We demonstrate the broadband nature of this approach by showing that one small vapor cell can be used to measure E-field strengths over a wide range of frequencies: 1 GHz to 500 GHz. The technique is validated by comparing experimental data to both numerical simulations and far-field calculations for various frequencies. We also discuss various applications, including: a direct traceable measurement, the ability to measure both weak and strong field strengths, compact form factors of the probe, and sub-wavelength imaging and field mapping.
引用
收藏
页码:6169 / 6182
页数:14
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