Modeling and simulation in atom probe tomography

被引：0

作者：

Larson, D. J. ^{[1
]}

Moody, M. P. ^{[2
]}

机构：

[1] Cameca Instrument Inc, 5470 Nobel Dr, Madison, WI 53711 USA

[2] Univ Oxford, Dept Mat, Parks Rd, Oxford OX1 3PH, England

来源：

MATERIALS CHARACTERIZATION | 2019年 / 149卷

关键词：

FIELD EVAPORATION;

D O I：

10.1016/j.matchar.2019.01.026

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：248 / 248

页数：1

共 16 条

[1] SIMULATION OF RAPID THERMAL PULSING FOR FIELD EVAPORATION [J].

CAMUS, PP ;

LARSON, DJ ;

KELLY, TF .

APPLIED SURFACE SCIENCE, 1993, 67 (1-4) :467-472

[2]

Cerezo A., 2005, MICROSC MICROANAL, V11, P878

[3] Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter [J].

Gault, B. ;

Vella, A. ;

Vurpillot, F. ;

Menand, A. ;

Blavette, D. ;

Deconihout, B. .

ULTRAMICROSCOPY, 2007, 107 (09) :713-719

[4] Spatial distribution maps for atom probe tomography [J].

Geiser, Brian P. ;

Kelly, Thomas F. ;

Larson, David J. ;

Schneir, Jason ;

Roberts, Jay P. .

MICROSCOPY AND MICROANALYSIS, 2007, 13 (06) :437-447

[5] COMPUTER-CONTROLLED TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE FOR STUDY OF DEFECTS IN METALS [J].

HALL, TM ;

WAGNER, A ;

SEIDMAN, DN .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (09) :884-893

[6]

Hren J.J., 1968, FIELD ION MICROSCOPY

[7] Field evaporation of oxides: A theoretical study [J].

Karahka, Markus ;

Kreuzer, H. J. .

ULTRAMICROSCOPY, 2013, 132 :54-59

[8] NUMERICAL-CALCULATION OF THE TEMPERATURE EVOLUTION AND PROFILE OF THE FIELD-ION EMITTER IN THE PULSED-LASER TIME-OF-FLIGHT ATOM PROBE [J].

LIU, HF ;

TSONG, TT .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (11) :1779-1784

[9] Applications of atom-probe tomography to the characterisation of solute behaviours [J].

Marquis, Emmanuelle A. ;

Hyde, Jonathan M. .

MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2010, 69 (4-5) :37-62

[10]

Miller M.K., 2014, ATOM PROBE TOMOGRAPH, DOI DOI 10.1007/978-1-4899-7430-3

← 1 2 →