Thin plasma-polymerized layers of hexamethyldisiloxane for humidity sensor development

被引:23
|
作者
Guermat, N. [2 ]
Bellel, A. [2 ]
Sahli, S. [1 ]
Segui, Y. [3 ]
Raynaud, P. [3 ]
机构
[1] Univ Mentouri Constantine, LMI, Fac Sci Ingenieur, Constantine 25000, Algeria
[2] Univ Mentouri Constantine, LEMEAMED, Fac Sci Ingenieur, Constantine 25000, Algeria
[3] Univ Toulouse 3, LAPLACE, CNRS, INPT, F-31062 Toulouse, France
关键词
Organosilicon; Thin films; Plasma deposition; Humidity; Sensor; Fourier transform infrared spectroscopy; SENSING PROPERTIES; SENSITIVE PROPERTIES; FILMS; IMPROVEMENT; DISCHARGE;
D O I
10.1016/j.tsf.2009.01.084
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The response of resistive-type sensors based on thin hexamethyldisiloxane layers to relative humidity (RH) was evaluated. Humidity sensitive layers were plasma polymerized at low frequency glow discharge using a capacitively coupled parallel plate reactor. The sensor design comprises the absorbing layer deposited on clean glass substrate with comb-shape aluminum electrodes (interdigitated structure). The change in electrical impedance of the sensing film was monitored as the device was exposed to humidity. The variation of the plasma-polymerization parameters resulted in different humidity sensing properties which could be correlated to the results of Fourier transform infrared spectroscopy (FTIR). The deposited films exhibited a detectable response to RH ranging from 30 to 95% with low hysteresis, good reproducibility and stability in long-term use. Films with a greater thickness showed a significant decrease in the humidity sensing capability. FTIR analysis revealed the presence of SiH bonding groups, which are frequently linked to the film density. The increase in the plasma discharge power induced also a significant decrease in the diffusion process of water vapor inside the sensitive layer bulk. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:4455 / 4460
页数:6
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