PCB Reverse Engineering Using Nondestructive X-ray Tomography and Advanced Image Processing

被引:46
作者
Asadizanjani, Navid [1 ]
Tehranipoor, Mark [1 ]
Forte, Domenic [1 ]
机构
[1] Univ Florida, Dept Elect & Comp Engn, Gainesville, FL 32611 USA
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 2017年 / 7卷 / 02期
基金
美国国家科学基金会;
关键词
Nondestructive imaging; reverse engineering (RE); X-ray tomography; CIRCUIT BOARDS; 3D;
D O I
10.1109/TCPMT.2016.2642824
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Reverse engineering (RE) of electronic systems is performed for many different reasons, including, but not limited to, failure analysis and fault isolation, obsolescence management, proof of IP rights infringement, security assessment, development of attacks, and counterfeiting. Regardless of the goal, it is imperative that the community understands the requirements, complexities, and limitations of RE. Traditional RE is based on a destructive process of serial sectioning followed by imaging, which is time-consuming, expensive, and error-prone. However, with the advent of advanced characterization tools and imaging software, this is starting to change. In this paper, we introduce a nondestructive approach for printed circuit board (PCB) RE based on X-ray tomography. The imaging parameters for a successful tomography are explained in detail and combined with advanced 3-D image processing and analysis to automate RE, thereby lowering the associated time and cost. We demonstrate our proposed process on two PCBs, a four-layer custom designed board, and a more complex commercial board. Lessons learned from this effort can be used to both develop advanced countermeasures and establish a more efficient workflow for instances where RE is unavoidable.
引用
收藏
页码:292 / 299
页数:8
相关论文
共 32 条
[1]  
[Anonymous], 2014, CENGAGE LEARNING
[2]  
[Anonymous], 2009, International Journal of Image Processing
[3]  
[Anonymous], 2010, Algorithms for Image Processing and Computer Vision
[4]  
[Anonymous], 2011, INTRO HARDWARE SECUR
[5]  
[Anonymous], 2015, PROC INT S TEST FAIL
[6]  
Asadizanjani N., 2014, THESIS
[7]  
Asadizanjani N., 2016, P 42 INT S TEST FAIL, P6
[8]  
Asadizanjani N, 2015, CERAM TRANS, V252, P425
[9]  
Asadizanjani N, 2015, DEVELOPMENTS IN STRATEGIC MATERIALS AND COMPUTATIONAL DESIGN V, P175
[10]  
Bao C, 2015, INT SYM QUAL ELECT, P47